Multiconductor Microstrip Lines Research Articles

EFFECT OF NON-UNIFORMITY OF THE MULTICONDUCTOR LINE CONSTRUCTIONAL PARAMETERS ON THE FREQUENCY CHARACTERISTICS OF THE MEANDER MICROSTRIP DELAY LINE / DAUGIALAIDĖS LINIJOS PARAMETRŲ NETOLYGUMŲ ĮTAKA MEANDRINIŲ VĖLINIMO LINIJŲ DAŽNINĖMS CHARAKTERISTIKOMS

Inhomogeneities of the electromagnetic field are observed at the edges of the electrodynamic delay systems which are designed based on the concept of infinite periodic multiconductor line. The influence of non-uniformity of characteristic impedance and effective permittivity of the multiconductor microstrip line on the frequency responses and characteristics of meander microstrip delay lines is studied in this paper. It is shown that aligning characteristic impedance and effective permittivity of the multiconductor line the bandwidth of the delay line can be significantly extended. Elektrodinaminių įtaisų, grįstų periodinių daugialaidžių linijų struktūra, kraštuose ir galuose pastebimi elektromagnetinių laukų netolygumai. Straipsnyje nagrinėjama charakteringojo impedanso ir efektyviosios dielektrinės skvarbos netolygumo įtaka meandrinių mikrojuostelinių vėlinimo linijų dažninėms charakteristikoms. Parodyta, kad suvienodinus daugialaidės linijos laidininkų charakteringuosius impedansus arba efektyviąsias dielektrines skvarbas galima praplėsti vėlinimo linijos pralaidumo juostą.

The Influence of Non-Uniformity of the Multi-Conductor Line Parameters on Frequency Responses of the Meander Delay Line

Inhomogeneities of the electromagnetic field are observed at the edges of the electrodynamic delay systems which are designed based on the concept of periodic multiconductor line. The inhomogeneity manifests itself as a non-uniformity of the characteristic impedance and the effective permittivity of the multiconductor line consisting of a finite number of conductors. The influence of non-uniformity of impedance and effective permittivity of the multiconductor microstrip line on the frequency responses and characteristics of meander delay lines is studied in this paper. It is shown that matching characteristic impedance and effective permittivity of the multiconductor line the bandwidth of the delay line can be extended and delay time increased preserving its dimensions. DOI: http://dx.doi.org/10.5755/j01.eee.19.6.4279

SYNTHESIS OF MULTICONDUCTOR MICROSTRIP LINES OPERATING IN NORMAL MODES / DAUGIALAIDĖS MIKROJUOSTELINĖS LINIJOS, VEIKIANČIOS NORMALIŲJŲ BANGŲ REŽIMU, SINTEZĖ

The article presents a synthesis technique for a symmetrically coupled multiconductor microstrip line operating in normal modes and looks at the examples of the synthesis of a ten-conductor symmetrically coupled multiconductor microstrip line operating in even- and odd normal modes. The paper investigates the dependences of the parameters of the introduced lines. Santrauka Straipsnyje išnagrinėtas simetrinių daugialaidžių mikrojuostelinių linijų, veikiančių normaliųjų bangų režimu, sintezės algoritmas. Kaip pavyzdys pateikti dešimties laidininkų simetrinės daugialaidės mikrojuostelinės linijos, veikiančios lyginės ir nelyginės bangų režimu, sintezės rezultatai, aprašyti linijos parametrai.

A spice model for multiconductor microstrip lines excited by an incident plane wave

AbstractThis article presents a SPICE model to analyze the terminal response of multiconductor microstrip lines excited by an incident plane wave. The analysis is based on multiconductor transmission line equations with the quasi‐TEM propagation mode approximation on microstrip lines and an accurate calculation of electromagnetic fields in the air/dielectric medium. The proposed SPICE model can be directly used for both the time‐domain and frequency‐domain analyzes and allows incorporating nonlinear and time‐varying loads. Several cases with an arbitrary plane wave incidence are simulated by using the proposed SPICE model. The results are in good agreement with those obtained using the Baum‐Liu‐Tesche equations model and full‐wave analysis simulator (by CST Microwave Studio Software). © 2011 Wiley Periodicals, Inc. Microwave Opt Technol Lett 53:2754–2761, 2011; View this article online at wileyonlinelibrary.com. DOI 10.1002/mop.26396

PARALLEL SYNTHESIS OF MULTICONDUCTOR MICROSTRIP LINES / LYGIAGREČIOJI DAUGIALAIDŽIŲ MIKROJUOSTELINIŲ LINIJŲ SINTEZĖ

The parallel technique for the synthesis of the multiconductor microstrip lines (MML) is presented in this article. Main parameter of the synthesised MML is characteristic impedance, variable parameters: width of the conductors, space between conductors, the thick of dielectric substrate and its permittivity. Authors’ created parallel algorithm is used in this technique, wherein analysis operations are distributed among cluster nodes. The MML model created using the finite difference method. To reduce analysis area it is assumed, what MML is infinite and periodic. Proposed technique was realized and proved in the sixteen nodes cluster. Cluster is based on Mpich2 software. Proved, that synthesis error is less than 1 %. Characteristics of the synthesised MML, compared with characteristics which calculated with other methods differ less than 6 %. It may be noted that, performance coefficient of the parallel synthesis algorithm is growing linear when cluster has no more than 16 nodes. Linear growth of performance coefficient demonstrates that adding more nodes to cluster reduce execution time of the synthesis.

An efficient integral method for capacitance extraction of multiconductor microstrip lines

A new integral method is developed to analyse multiconductor microstrip lines in quasi-static. The capacitance matrix of two and eight transmission lines has been successfully calculated by using our approach. The developed method is based on the generalised equivalent circuits technique and using transverse admittance operators. The obtained integral equations are solved using Galerkin’s method. This approach evaluates directly the accurate determination of capacitance matrix characterised by variational form. To improve the computation efficiency and the accuracy, the unknown charges are expanded in terms of compactly-supported wavelets. Thus highly sparse matrixes are generated and a significant reduction of computational time and memory storage are obtained. Numerical results are in good agreement with those in previous publications. 

Circular Symmetric Multiconductor V-Shaped Transmission Lines: A New Type of Microwave Interconnects

In this paper a new coupled transmission line is introduced which is a combination of the Circular Symmetric Multiconductor Microstrip Line (CSMSL) and the V-shaped microshield. As a result the crosstalk has been reduced greatly. A static analysis is performed using the Finite Difference method and the static parameters and coupling effects of this structure is compared with the CSMSL structure. Also the time domain response of this Multiconductor Transmission Line (MTL) is presented.

Response of Circular Symmetric Multiconductor Microstrip Line to an Electromagnetic Field

The primary-secondary field idea is used to determine the response of a circular symmetric multiconductor microstrip line (CSMSL) to an external electromagnetic plane wave. The primary field is obtained analytically for the cases of oblique TM/sup z/ and TE/sup z/ polarized incidence. The secondary field is determined using excited multiconductor transmission line theory. The method is examined to obtain the effect of external illumination on a four-strip CSMSL and some useful results are obtained.

Dispersion of the fundamental mode in coupled multiconductor microstrip lines

Dispersion of the fundamental mode in coupled multiconductor microstrip lines

Application of the complex image method to multilevel, multiconductor microstrip lines

This article demonstrates the use of the complex image method for analysis of multilevel, multiconductor microstrip lines in which sources are embedded in a bounded region of a multilayered structure. A modified “relay race” technique is developed for the Green's functions when the source and field points are located on different planes of the multilevel microstrip structure. Current distributions on the microstrip lines are determined using the mixed-potential integral equation method in conjunction with triangular discretization. A procedure for extracting scattering parameters with ports of unequal impedance is also included. © 1997 John Wiley & Sons, Inc. Int J Microwave Millimeter-Wave CAE 7: 359–367, 1997

Application of the complex image method to multilevel, multiconductor microstrip lines

This article demonstrates the use of the complex image method for analysis of multilevel, multiconductor microstrip lines in which sources are embedded in a bounded region of a multilayered structure. A modified “relay race” technique is developed for the Green's functions when the source and field points are located on different planes of the multilevel microstrip structure. Current distributions on the microstrip lines are determined using the mixed-potential integral equation method in conjunction with triangular discretization. A procedure for extracting scattering parameters with ports of unequal impedance is also included. © 1997 John Wiley & Sons, Inc. Int J Microwave Millimeter-Wave CAE 7: 359–367, 1997

Shape sensitivities of capacitances of planar conducting surfaces using the method of moments

In this contribution, a new method is presented to obtain the sensitivities of the capacitance or the charge with respect to a geometrical parameter of planar conducting surfaces. The charge density is found by an integral equation technique. By applying the flux-transport theorem, a new integral equation for the total derivative of the charge with respect to a geometrical parameter is derived from the original electrostatic integral equation for the charge distribution. This new integral equation is solved together with the original integral equation by the method of moments using the same set of basis and test functions. The method is also applied to obtain derivatives for the inductance, impedance and effective dielectric constant. Some simple electrostatic problems are presented, which illustrate the capabilities of our approach. In these examples we also discuss the difference between the geometrical derivatives obtained in this way with geometrical derivatives which are obtained by a central finite difference estimate. Next, some examples of the calculation of geometrical derivatives of capacitance and inductance matrices of multilayer, multiconductor thin microstrip lines are discussed.

Fuul-wave analysis for coupling characteristics of multiconductor microstrip lines on semiconductor substrate

The coupling effects for multiconductor microstrip on semiconductor substrate are analyzed by full-wave spectral domain approach. It is believed that the contribution aforementioned will facilitate successful design of MMIC modules in millimeter wave band and very high-speed digital integrated circuits.

Efficient spectral domain analysis of generalized multistrip lines in stratified media including thin, anisotropic, and lossy substrates

The full-wave analysis of multiconductor microstrip lines used in electooptic modulators (EOMs), MMICs, or high-speed VLSI applications is addressed. An arbitrary number of coupled coplanar strips are embedded in a stratified medium involving iso/anisotropic dielectric and/or semiconductor layers. The numerical aspects of the computation of the propagation constants using spectral domain analysis (SDA) are stressed. An efficient scheme is used to accurately compute attenuation and propagation constants and current distributions with reasonable CPU times. Convergence problems due to the existence of very thin layers adjacent to the metallized interface have been explicitly considered. An algorithm for computing the modal characteristic impedances regardless of the number and nature of substrate layers is provided. A reciprocity related definition of modal impedances is used to ensure the symmetry of the multiport scattering matrix associated with the structure.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>

Measured capacitance coefficients of multiconductor microstrip lines with small dimensions

Measured capacitance coefficients of parallel microstrip lines with widths between 10-20 mu m, spaces between 5-60 mu m, and dielectric thickness between 10-15 mu m on silicon substrates are reported. The experimental data are compared with results computed from a two-dimensional finite-element simulation program called WIRECAP. The comparison shows good agreement, with an accuracy of +or-5% for the total capacitance and not=20% for the coupling capacitance. WIRECAP is also shown to be in good agreement with other available simulation programs, such as the University of Arizona capacitance calculator (UAC) program. The measured near-end crosstalks are reported and it is shown that they can be accurately predicted by using the measured coupling capacitance.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>

Wave propagation in weakly coupled microstrip lines — an anomalous degenerate quasi‐tem solution

AbstractCoupled‐mode analysis of multiconductor microstrip lines, based on quasi‐TEM approximations, leads to a wave solution usually obtained by superposition of exponential elementary waves. This paper shows that critical situations exist where such simple exponential waves cannot describe the propagation phenomenon. Particular relationships among the quasistatic parameters of a two‐conductor asymmetrical microstrip line are obtained allowing the synthesis of a physically realizable critical situation where an anomalous wave solution is required.

A Frequency-Dependent Coupled-Mode Analysis of Multiconductor Microstrip Lines with Application to VLSI Interconnection Problems

The spectral Galerkin procedure is used to calculate the dispersion properties of multiple conductor microstrip lines. The resulting propagation constants are then used in a coupled-mode theory which demonstrates a frequency-dependent coupling of current in a five-conductor system. These results should he useful in the study of crosstalk between parallel microstrip lines used in VLSI interconnections.