Abstract
This article demonstrates the use of the complex image method for analysis of multilevel, multiconductor microstrip lines in which sources are embedded in a bounded region of a multilayered structure. A modified “relay race” technique is developed for the Green's functions when the source and field points are located on different planes of the multilevel microstrip structure. Current distributions on the microstrip lines are determined using the mixed-potential integral equation method in conjunction with triangular discretization. A procedure for extracting scattering parameters with ports of unequal impedance is also included. © 1997 John Wiley & Sons, Inc. Int J Microwave Millimeter-Wave CAE 7: 359–367, 1997
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