In this work, the interface strengthening behavior of nanostructural W/NbMoTaW medium-entropy multilayer films with different W layer thicknesses was studied by a nanoindentation test. Results indicated that the hardness of multilayer films presented a significant size-dependent effect with the decrease of W layer thickness. The multilayer film reached a peak hardness of 19.8 GPa on account of interface strengthening at the critical layer thickness of 10 nm. An amorphous NbMoTaW layer leads to a decrease in hardness of multilayer films when W layer thickness was less than 10 nm. The room temperature toughness of the multilayer films predicted by the hardness/modulus ratio was improved with the decrease of W layer thickness. The size-dependent interface strengthening due to the decreasing W layer thickness and the solid solution strengthening due to the severe lattice distortion of the NbMoTaW layer are the main strengthening mechanisms of the multilayers.
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