The Effect of annealing on molecular ordering in Iron Phthalocyanine (FePc) thin films deposited on Si (111) substrate surface was investigated using lab source (Cu Kα) based x-ray diffraction, synchrotron based 2-dimensional grazing incidence x-ray diffraction, polarization dependent x-ray absorption spectroscopy and hard x-ray photoelectron spectroscopy. Room temperature deposition of FePc on Si substrate resulted in amorphous thin films with randomly oriented FePc molecules. However, annealing of these amorphous films at 200°C led to crystallization with highly ordered FePc molecules having monoclinic crystal lattice structure. The ordered FePc molecules followed edge-on stacking on Si substrate surface with an azimuthally averaged tilt angle of 75±5° between molecular plane and substrate surface. Also, the b-c plane of the unit cell was lying almost parallel to the substrate surface. The edge-on stacking ordering of FePc molecules in annealed thin films led to higher charge conduction as compared to as-deposited films.
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