Photo-epitaxy excited by synchrotron radiation (SR) has been achieved using a disilane molecular beam. The surfaces of the as-grown films deposited at silicon substrate temperatures of 380–720 °C exhibit a 2 × 1 reconstructed reflection high energy electron diffraction pattern, indicating two-dimensional growth. No carbon and oxygen contamination by SR is detected in the epitaxial film. In the temperature range below 600 °C, the SR-excited growth rate is larger than that of thermal growth. This result suggests that SR enhances the surface reactions, such as desorption of hydrogen and surface migration of adsorbed species. Low temperature cleaning of a silicon surface using disilane gas has been carried out using photochemical reactions excited by SR. Epitaxial growth is attained on a silicon surface cleaned by this method at 700 °C. The oxygen concentration at the interface between the substrate silicon and the epitaxial film is reduced by decreasing disilane beam intensity and increasing cleaning temperature. The principal reaction is attributed to the SR-enhanced reduction of surface oxide by adsorbed silicon atoms.
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