Autonomous smart windows may be integrated with a stack of active components, such as electrochromic devices, to modulate the opacity/transparency by an applied voltage. This voltage may be generated with a visibly transparent photovoltaic device. This paper describes the processing and performance of zinc oxide (ZnO) films for integration with electrochromic stacks. Sputtered ZnO (2% Mn) films on indium–tin oxide with transparency in the visible range were used to fabricate metal–semiconductor (MS), metal–insulator–semiconductor, and p-i-n heterojunction devices, and their photovoltaic conversion under ultraviolet (UV) illumination was evaluated with and without oxygen plasma-treated surface electrodes (Au, Ag, Al, and Ti/Ag). The MS Schottky parameters were fit against the generalized Bardeen model to obtain the density of interface states ( ${D}_{\textsf {it}} \approx \textsf {8.0}\times \textsf {10}^{\textsf {11}}$ eV−1cm−2) and neutral level ( ${E}_{o} \approx -\textsf {5.2}$ eV). These devices have exhibited a photoconductive behavior at $\lambda = \textsf {365}$ nm, and low-noise Ag-ZnO detectors have exhibited the responsivity ( ${R}$ ) and photoconductive gain ( ${G}$ ) of $\textsf {1.93}\times \textsf {10}^{-\textsf {4}}$ A/W and $\textsf {6.57}\times \textsf {10}^{-\textsf {4}}$ , respectively. Confirmed via matched-pair analysis, postmetallization oxygen plasma treatment of Ag and Ti/Ag electrodes has resulted in increased Schottky barrier heights, which maximized with a 2-nm SiO2 electron blocking layer, coupled with the suppression of recombination at the MS interface and blocking of majority carriers. For interdigitated devices under monochromatic UV-C illumination, the open-circuit voltage ( ${V}_{\textsf {oc}}$ ) was 1.2 V and short-circuit current density ( ${J}_{\textsf {sc}}$ ), due to minority carrier tunneling, was 0.68 mA/cm2.