physica status solidi (a)Volume 109, Issue 1 p. K75-K78 Short Note Effect of thickness and length of the sample on the dielectric constant ϵ′ and loss ϵ″ measurements in the microwave cavity perturbation technique V. R. K. Murthy, V. R. K. Murthy Department of Physics, Indian Institute of Technology, Madras Search for more papers by this authorR. Raman, R. Raman Department of Physics, Indian Institute of Technology, Madras Search for more papers by this author V. R. K. Murthy, V. R. K. Murthy Department of Physics, Indian Institute of Technology, Madras Search for more papers by this authorR. Raman, R. Raman Department of Physics, Indian Institute of Technology, Madras Search for more papers by this author First published: 16 September 1988 https://doi.org/10.1002/pssa.2211090158 Madras 600 036, India. AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat Volume109, Issue116 September 1988Pages K75-K78 RelatedInformation