Abstract
The transient nature of optical absorbance and the microwave cavity perturbation technique are used to measure the minority carrier lifetime in a polycrystalline thin film of Zn 3P 2 as well as to observe the spectral photoabsorbance. It has been observed that the transient decay curves consist of two components attributed to the surface carriers and the bulk carriers. The analysis of these spectral variation of carrier lifetime and spectral photoabsorbance indicate the possible band-band transitions in this material.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
