Cadmium sulfide (CdS) thin films (thickness: 200 nm) were grown over silicon (Si) substrate via thermal evaporation deposition method, where the ultimate pressure and deposition rate were 1 × 10−6 torr and 1.0-1.2 Å/sec, respectively. X-ray diffraction established polycrystalline films with a hexagonal crystal structure and preferred orientation (002). The energy dispersive analysis of X-ray has recognized pure and stoichiometric films. The uniform, dense and smooth films with low roughness (1.4 nm) appeared in atomic force microscopy. The scanning electron microscopy characterization has recognized a continuous and defects-free film (like cracks, pinholes and overhang) with a uniform distribution of interconnected nanoparticles (size: 24.5–35.1 nm). The good adhesion of the film was confirmed via a scotch tape test. Ellipsometry revealed that the grown CdS film has a refractive index of 2.42–2.45. Thus, polycrystalline CdS film with hexagonal phase (highly stable, wide bandgap, high transmission, environmentally tolerable, and good mechanical strength) could be utilized as a suitable window material and passivation agent in the fabrication of solar cell and infrared detector, respectively.
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