Abstract In the case of trustworthy products, accelerated life tests are crucial techniques used to gather information regarding the lifetime of the target population with a shorter time frame compared to routine investigations. The received data in higher stress levels than normal are then used to predict the reliability of the product under consideration in regular working circumstances. In this paper, the constant-stress accelerated life tests are employed when the data are obtained through a progressive Type-II censoring strategy from Nakagami populations. Besides estimating the model parameters, the reliability function under the usual use conditions is predicted using four estimation procedures. The maximum likelihood, least squares, weighted least squares and maximum product of spacing estimation approaches are utilized for estimation purposes. In addition, two interval estimation methods are considered utilizing the asymptotic features of the maximum likelihood and maximum product of spacing estimates. A simulation investigation is conducted to evaluate the efficiency of diverse point and interval estimations beneath various strategies involving sample sizes, effective number of failures, and removal designs. From a practical perspective, a pair of datasets related to the failure times of coupons cut from aluminum sheeting and white organic light-emitting diodes are explored to confirm the effectiveness of the theoretical findings.
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