The effect of RF power on the nanocrystallization of a Si:Hnetwork has been studied by PECVD at a substrate temperature of200 °C and a gas pressure of 0.5 Torr, using silane as the source gas and helium as diluent, withoutusing hydrogen. Optical characterization of the films has been done by UV–vis spectroscopy.Structural characterization has been performed by infrared absorption, x-ray diffraction,micro-Raman studies and electron microscopy by HRTEM and FESEM. In general, astructural transformation from the amorphous to nanocrystalline phase accomplished bymetastable helium atoms in the plasma has been identified at a low RF power of 80 W.With an increase in the applied RF power up to 150 W, systematic improvement incrystallinity has been shown as depicted by increased crystalline volume fraction(∼77%), smaller grain size(∼7 nm) reduced bondedhydrogen content (∼8 at.%), enhanced polymerization in the network and gradual widening in the optical gap(∼1.86 eV) obtained at ahigh deposition rate (107 Å min−1), using 1 sccm of silane as the source gas and helium as the only diluent. He dilution of theSiH4 plasma is a well-proven approach to increase the growth rate. However, a nanocrystallinenetwork with high crystalline volume fraction and well-aligned crystallographic latticedistribution, attained in Si:H from a low-power RF plasma at a growth temperature as low as200 °C, and that obtained from purely He dilution, without usingH2, is being reported for the first time. The striking feature comprises that nc-Si:H films ofincreasing crystalline volume fraction, reduced bonded hydrogen content and wider opticalgap are produced with simultaneously increasing deposition rates, which deserves extensivetechnological impact.
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