The molecular structure and conformation of tetraphenylsilane have been investigated by gas-phase electron diffraction and ab initio/DFT and molecular mechanics calculations. The structure of the free molecule is consistent with an S4 symmetry conformation; the calculations indicate that the twist angle τ between the plane of the phenyl group and the plane defined by the Si−C bond and the S4 axis is about 40°. Analysis of the low-frequency modes indicates that the four phenyl groups undergo large-amplitude torsional and bending vibrations about the respective Si−C bonds. The electron diffraction intensities from a previous study [Csakvari, E.; Shishkov, I. F.; Rozsondai, B.; Hargittai, I. J. Mol. Struct. 1990, 239, 291] have been reanalyzed, using constraints from the calculations. A dynamical model accounting for the large-amplitude bending motion of the phenyl groups was used in the refinement. The new analysis yields accurate values for the twist angle of the phenyl group, τ = 40 ± 2°, and the Si−Ph bo...
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