Ion Scattering Spectroscopy Research Articles

Characterizing the surface compositions of supported bimetallic PtSn clusters: Effects of cluster-support interactions and surface adsorbates

PtSn bimetallic clusters on TiO2(110) and highly oriented pyrolytic graphite (HOPG) surfaces have been characterized by scanning tunneling microscopy, low energy ion scattering (LEIS), X-ray photoelectron spectroscopy, and temperature programmed desorption (TPD); density functional theory (DFT) calculations have also been performed to better understand adsorption of CO and D2 on the PtSn surfaces. On TiO2 at coverages of 2 ML of Pt and 2 ML of Sn, exclusively bimetallic clusters are formed for both orders of deposition because clusters of the first metal completely cover the surface such that all atoms of the second metal are incorporated into the existing clusters. In contrast, on HOPG, the high mobility and weak cluster-support interactions on HOPG result in much larger 2 ML monometallic clusters (∼30 Å high) that do not completely cover the surface, and deposition of the second metal produces larger clusters as well as smaller ones. Despite the difference in cluster morphologies for the different orders of deposition and supports, the LEIS experiments demonstrate that in all cases, the PtSn clusters are rich in Sn at the surface, as expected based on the lower surface free energy for Sn compared to Pt. Furthermore, the +0.2 eV shift in the Sn(3d5/2) binding energy observed on all surfaces in the presence of Pt is consistent with PtSn alloy formation. Deposition of 2 ML of Sn on TiO2 produces two-dimensional clusters with oxidation of Sn and reduction of titania at the cluster-support interface, but addition of Pt to the Sn clusters causes Sn to diffuse away from this interface, leaving Sn in the metallic state. TPD experiments on 2 ML Pt/TiO2 with increasing coverages of Sn show that the number of adsorption sites for D2 sharply decreases to nearly zero at 0.5 ML, while CO adsorption decreases to zero only at much higher Sn coverages of 2 ML. DFT studies for Sn modified Pt surfaces and bulk structures demonstrate that for CO adsorption at low Sn coverages (≤0.25 ML), the strong Pt-CO interactions induce diffusion of Pt to the cluster surface and the formation of a bulk Pt3Sn alloy, whereas D2 adsorption does not lead to interactions with the Pt surface that are strong enough to induce alloy formation. A single Sn adatom prevents D2 adsorption on four neighboring Pt atoms via site-blocking and the donation of electron density to Pt.

A review of ion scattering spectroscopy studies at liquid interfaces with noble gas ion projectiles

Ion scattering spectroscopy (ISS) is an analytical tool that provides direct structural, topographical, and atomic compositional information at interfaces when ions are used as projectiles. Since its development in 1967, ISS is commonly used to obtain quantitative information about solid interfaces. Over the last couple of decades, ISS has emerged as an important technique to probe liquid interfaces and their studies employing ISS has become not uncommon, more so with Neutral impact collision ion scattering spectroscopy (NICISS). Therefore, here the principle of ISS with a particular focus on NICISS and its data evaluation are summarised while reviewing some important studies at vapor-liquid interfaces that provide direct information for molecular orientation of liquids (including ionic liquids), composition and distribution of atoms (or solutes) and charges as a function of depth to gain vast variety of thermodynamical information. Employing ISS such information can be achieved with high depth resolution of ∼1–2 Å (depending on the nature of the experiment). These examples highlight the significance of ISS and show potential for its application for studies related to specific ion effects, atmospheric reaction in aerosol and sea water droplets, and even determining the fate of environmental pollutants like heavy metal ions and per-fluoroalkyl substances (PFAS). Furthermore, some limitations of ISS are also discussed relating to investigation of high-vapor pressure liquids and probing buried interfaces like liquid-liquid interfaces while presenting progresses made in probing solid-liquid interfaces.

The surface chemistry of the atomic layer deposition of ruthenium on aluminum and tantalum oxide surfaces

The surface chemistry of Ru atomic layer deposition (ALD) processes based on the use of tris(2,2,6,6-tetramethyl-3,5-heptanedionato)ruthenium(III) (Ru(tmhd)3) and either molecular oxygen or atomic hydrogen on aluminum oxide films was characterized by a combination of surface-sensitive techniques. The thermal decomposition of the Ru metalorganic precursor was determined, by using a combination of reflection-absorption infrared spectroscopy (RAIRS), temperature programmed desorption (TPD), and X-ray photoelectron spectroscopy (XPS), to start below 400 K and to take place in a stepwise fashion over a wide range of temperatures. Gas-phase products from this chemistry include 2,2,6,6-tetramethyl-3,5-heptanedione (the protonated ligand, Htmhd; in a TPD peak at 520 K), isobutene (540 K; indicating the fragmentation of the organic ligands), and other products from isomerization and/or aldol condensation (650 and 730 K). This chemistry is accompanied by the reduction of the Ru3+ ions in two stages, involving the loss of some of their ligands and their direct bonding to the substrate first (between 500 and 600 K) and a full reduction to a metallic state later on (600–700 K). ALD cycles using either molecular oxygen or atomic hydrogen resulted in the slow build-up of Ru on the surface, but the co-deposition of carbon could not be avoided, at least in the initial cycles, while the alumina surface was still exposed. With O2, the Ru atoms alternate between partially-oxidized (after the O2 exposures) and zero-valent (after the Ru(tmhd)3 doses) states, and some Ru loss in the form of the volatile RuO4 oxide was seen after the second half of the ALD cycles; neither the Ru oxidation state alternation nor the elimination of some Ru from the surface were observed when using H·. The deposited Ru was determined, by combining results from angle-resolved XPS (ARXPS) and low-energy ion scattering (LEIS) experiments, to grow as 3D nanoparticles rather than as a layer-by-layer 2D film, presumably because the Ru precursor preferentially adsorbs (and decomposes more cleanly) on the metal surface. A discussion is provided of the implications of these results for the design of ALD processes.

Examining the influence of W thickness on the Si-on-W Interface: A comparative metrology analysis

W/Si thin-film multilayer structures are used in various applications such as X-ray, neutron, and extreme ultraviolet optics. The interfaces between the films play such a fundamental role in the performance of these structures that a sub-nanometer and non-destructive characterization of such interfaces is necessary, albeit challenging. In this study, we investigate the interface Si-on-W and the effect of W thickness on such an interface using low energy ion scattering (LEIS), X-ray reflectivity (XRR), and transmission electron microscopy (TEM). We extract the Si-to-W error-function-like compositional change to quantitatively compare the effective interface width measured by the different techniques. We demonstrate that, in the case of Si-on-W, the effective interface width measured by LEIS and XRR agrees with the values extracted from TEM analysis within a 0.1 nm error margin. Noting that TEM is a destructive method, these results exemplify the value of LEIS and XRR as analysis techniques for resolving thin film interfaces. Surprisingly, all techniques employed in the study show that a structure with 20 nm of W has a sharper Si-on-W interface compared to a structure with 4 nm of W, which we interpret as the effect of both the correlated roughness from the substrate − present in the case of 4 nm W − and the larger crystals − present in the W film in the case of 20 nm W- resulting in less intermixing. This directly shows the value of extracting exact interface widths for the analysis and understanding of thin film growth in multilayer systems.

Signal oscillations in helium scattering by bismuth atoms in the low energy range

Low Energy Ion Scattering (LEIS) analysis of bismuth selenide (Bi2Se3), a strong 3D topological insulator, revealed oscillations of the detected signal in dependence on primary ion beam energy. Bismuth is a part of the group of elements where oscillatory behaviour was already noticed, such as gallium, indium, or lead. Generally, it is ascribed to quasi-resonant charge exchange processes between primary ion and target atom. Moreover, clear differences exist between data for target atoms in elemental form and for atoms in compound form. A study of Bi signal yields in different material forms was performed for primary He+ projectiles within the energy range from 0.50 to 6.00 keV. A foil of pure Bi, Bi2Se3, Bi2O3 and thin Bi films deposited on several substrates (SiO2, CuOx) by Molecular Beam Epitaxy were analysed. The energy shift in the position of oscillations was observed when the oxygen atoms were present at the surface and bonded to Bi atoms. A description of the Bi ion yield variation is provided to facilitate the quantification process in LEIS.

Annealing effect on deuterium retention in W-Cr-Y alloy

Deuterium (D) trapping in the W-11.4Cr-0.6Y alloy manufactured by field assisted sintering technology (FAST) and pre-annealed at temperatures of 1050, 1250, 1473 K was studied by in-situ thermal desorption spectroscopy (TDS). D incorporation in W-11.4Cr-0.6Y alloy was carried out by irradiation with deuterium ions (670 eV/D+) to a fluence of 5 × 1019 D/m2. The change in Cr concentration in the bulk of the W-Cr-Y alloy was studied using energy dispersive spectroscopy (EDS). The elemental composition on the surface of alloy samples before and after annealing was investigated using low energy ion scattering spectroscopy (LEIS). The Cr concentration increases on the surface of alloy sample during annealing at 1000 and 1050 K due to intensive Cr segregation, while it decreases at temperatures of 1250 K and above by dominant Cr sublimation. Pre-annealing of W-Cr-Y alloy at 1050 K leads to a decrease in the D trapping in the alloy which is connected with an increase in the Cr concentration on the surface. At high annealing temperatures of 1250 K and above, the appearance of new phases and decomposition-induced grain refinement leads to new types of defects with high binding energy for D.

The value of charge of Fe single to multiple atoms doped in Ge: Combined experimental and density functional theory study

With the aim to find out the value of an electronic charge that the Fe atoms acquire when they are doped in Ge bulk, a set of experimental and density functional theory (DFT) studies have been carried out of the model systems consisting of intermixed Fe–Ge films. Such films were prepared by electron and thermal evaporation in ultra-high vacuum (UHV) on the surface of Mo(110) substrate by initial formation of the Ge film of a mean thickness of 7.5 nm, onto which the Fe films were subsequently deposited, maintaining certain Fe to Ge concentration ratio, namely, 0.2, 0.4, 0.7 and 1.0. Annealing of such double Fe–Ge films results in notable interdiffusion of the components with quite uniform distribution of the elements throughout the intermixed layer. The details of formation of such layers were in-situ controlled by Auger electron spectroscopy (AES), low-energy ion scattering spectroscopy (LEIS), low-energy electron diffraction (LEED) and work function measurements, in combination with Ar ion depth profiling. By analyzing the Fe Auger LMM-triplet, the absolute values of the charge that Fe atoms acquire when doped in Ge, were estimated for four different Fe–Ge intermixed layers with above-mentioned different Fe to Ge concentration ratio. The corresponding plot of the charge versus Fe to Ge concentration allows to estimate the charge of a single doped Fe atom, which equals to +0.34e (electron charge units) and gradually decreases to 0.07e for high Fe concentration. To verify the experimental values of the Fe charge the calculations were done by periodic DFT as implemented in full-potential FHI-aims code. Among the used algorithms of Mulliken, Hirshfeld, and Bader's atoms-in-molecules, the latter gives good correlation between charges of Fe dopant and its concentration.

A practical guide to interpreting low energy ion scattering (LEIS) spectra

Low-Energy Ion Scattering (LEIS) spectrometry is extraordinarily sensitive and specific to the outermost atomic layers of materials. It is a powerful tool for surface science. Here, we present a practical guide on LEIS spectral interpretation that is based on actual LEIS spectra of a variety of materials. While this article covers some of the theory of LEIS, it is not an exhaustive description of this aspect of the technique. Rather, it is intended for the broad community of scientists who, while not necessarily active users of LEIS instruments, need LEIS in their research, perhaps obtaining LEIS spectra by collaboration or encountering it in the scientific literature. The spectra/experimental results we present reflect both basic and advanced features of LEIS. We believe this guide is quite comprehensive. Most of the spectra shown herein were obtained on a modern high sensitivity (HS)-LEIS instrument. The analyser of this instrument defines and fixes a scattering angle of 145°. However, these results are representative of other widely used geometries. The features of these spectra are quite general. Key concepts covered in this work include surface peaks, elements that promote reionization, double and multiple scattering/collisions, quantification with reference materials, the effect of contamination, differences between particulate and crystalline materials/surfaces, direct scattering from the second atomic layer of a material, and the use and effects of different primary ions, e.g., He+, Ne+, and Ar+. The LEIS spectra shown and discussed in this work come from different materials, including as-received, clean, and oxidized Cu, silicone rubber, Ca evaporated onto SiO2, Al, graphene on Cu, Fe, Rh, FeRh, CaF2, native silicon oxide (SiO2) on silicon, BeO, B2O3, Bi2Se3, Teflon (polytetrafluoroethylene), LiF, SrTiO3, an alloy with five elements (Cr, Mn, Fe, Co and Ni), and Au. Many of these materials are of substantial technological interest.

Cathode Surface Segregating Modification for Boosting Oxygen Reduction Reactions: Coupling Theory and Experiment in Proton Conducting Solid Oxide Fuel Cells (H-SOFCs)

The surface electrochemical catalysis reaction is complex due to the unpredictable surface morphology and severe reaction environment, especially for cathodes in proton conducting solid oxide fuel cells (H-SOFCs) where water vapor is generated and evaporated at a high operating temperature. The first-generation cathode materials (LaxSr1-xMO3-δ, M=Fe, Co, Mn) tend to have A-site cation segregation, and this segregation layer reduces the performance. Surface segregation phenomena tends to be ignored by computer simulations because surface termination is described as a highly crystallized layer, misleading the development of material computing science. Therefore, a combination of theory and surface investigation is essential for future work in this community. In this work, we use density functional theory (DFT) for designing a higher-performing cathode material, La0.35Bi0.15Sr0.5FeO3-δ (LBSF), for improvement of both bulk and surface electrochemical character in an intrinsic manner, predicting a candidate material with good performance that can be used in solid oxide proton conducting fuel cells (H-SOFCs). By combining a sensitive surface analysis technique, low energy ion scattering (LEIS), surface segregation is finely considered and determined that the particles are fully covered with a Sr segregation layer on the outer most surface. Aberration-Corrected transmission electron microscopy (ACTEM) is also applied and shows an amorphous structure at the particle edge. With the determination of this segregation layer, a reality-closed model is given, and related surface reactions are modelled based on this layer instead of a conventional cleaved, well-crystallized surface. Also, as bismuth diffuses towards the surface due to the lone pair effect, the segregation becomes an oxygen reduction reaction preferred layer instead of a blocking layer. After computational prediction and surface analysis, LBSF is successfully applied into H-SOFCs and shows excellent performance with a peak power density of 1630 mW cm−2 at 700 oC. In addition, long term stability tests were conducted to ensure stability in future commercial use, and the experimental results show that LBSF works stable under extremely high temperature operating environments. In addition, a full cell was stabilized for about 300 hours, indicating a potential commercial application in the future.

Catalytic Activity of LnCo0.5Ni0.5O3-Δ (Ln = La, Pr, Nd) "Positrodes" on Ceramic Protonic Electrolytes

Proton-conducting solid-oxide electrolyzers and fuel cells represent viable, intermediate-temperature green energy conversion and storage technologies. Interest in this class of materials as electrolytes stems from their high ionic conductivity and inherent advantages in the gas flow configuration over traditional solid oxide cells in which the electrolyte is an oxygen ion conductor. However, their commercial viability has been hindered, in part, by the development of corresponding single-phase electrode components with mixed proton-electron conductivity and effective catalytic activity toward oxygen reduction and evolution reactions (ORR/OER). This paper investigates the origin of catalytic activity in LnCo0.5Ni0.5O3-δ (Ln=La, Pr and Nd) perovskites positrodes (positive electrode) by low energy-ion scattering (LEIS) and DFT studies. LEIS results reveal that La, Pr, and Pr cations dominate the outer atomic layer, with profound implications for catalytic activity. Whereas First principle calculations were performed using the plane-wave DFT method and hybrid HSE06 functional suggest, the catalytic activity and electronic properties depend on the valence shell structure of the Ln-site cation and their redox properties.AcknowledgmentsThe authors gratefully acknowledge financial support through JSPS KAKENHI Grant-in-Aid for Scientific Research (C), No. 19K05672, NEDO (International collaboration work in the field of clean energy) JPNP20005, the International Institute for Carbon-Neutral Energy Research (I2CNER) sponsored by the World Premier International Research Center Initiative (WPI),

Surface Characterization - Gallium Nitride Depth Profiling with LEIS

With the increasing use of III-nitride semiconductors, more knowledge is needed about the manufacturing processes and reactions with different chemicals. Gallium nitride semiconductors show a different behavior in wet chemistry compared to the known silicon technologies [4,5]. The different behavior can be explained, among other things, by the polar axis in the c-direction [0001] [6]. Surface characterization is necessary to gain a better understanding of the native surface and after different processes. We have used Low Energy Ion Scattering (LEIS) with its very high sensitivity for surface characterization to characterize the surface of different gallium nitride semiconductors and to establish a depth profile by sputtering [1,8].

Superthermal Al Atoms as a Reactive-Atom Probe of Fluorinated Surfaces.

We demonstrate a proof-of-concept of a new analytical technique to measure relative F atom exposure at the surfaces of fluorinated materials. The method is based on reactive-atom scattering (RAS) of Al atoms, produced by pulsed laser ablation of solid Al at 532 nm. The properties of the incident ground-state Al were characterized by laser-induced fluorescence (LIF); at typical ablation fluences, the speed distribution is approximately Maxwellian at ∼45000 K, with a most-probable kinetic energy of 187 kJ mol-1 and a mean of 560 kJ mol-1 When these Al atoms impact the surfaces of perfluorinated solids (poly(tetrafluorethylene), PTFE) or liquids (perfluoropolyether, PFPE), gas-phase AlF products are clearly detectable by LIF on the AlF A-X band. Quantitative AlF yields were compared for a small representative set of a widely studied family of ionic liquids based on the common 1-alkyl-3-methylimidazolium ([Cnmim]+) cation. Yields of (1.9 ± 0.2):1 were found from [C2mim][Tf2N] and [C8mim][Tf2N], containing the common fluorinated bis(trifluoromethylsulfonyl)imide anion ([Tf2N]-). This is in quantitative agreement with previous independent low-energy ion scattering (LEIS) measurements and consistent with other independent results indicating that the longer cationic alkyl chains cover a larger fraction of the liquid surface and hence reduce anion exposure. The expected null result was obtained for the ionic liquid [C2mim][EtSO4] which contains no fluorine. These results open the way for further characterization and the potential application of this new variant of the RAS-LIF method.

Resolving buried interfaces with low energy ion scattering

We investigate the use of low energy ion scattering (LEIS) to characterize buried interfaces of ultrathin films. LEIS spectra contain depth-resolved information in the so-called subsurface signal. However, the exact correlation between the subsurface signal and the sample’s depth composition is still unknown. For this reason, LEIS spectra so far only provided qualitative information about buried interfaces. In this study, we investigate nm-thin films of Si-on-W and Si-on-Mo, where we compare simulated data to LEIS spectra. We present a method to extract depth-sensitive compositional changes—resolving buried interfaces—from LEIS spectra for the first few nanometers of a thin-film sample. In the case of Si-on-Mo, the simulation of the LEIS subsurface signal allows obtaining a quantitative measurement of the interface profile that matches the value determined using the LEIS layer growth profile method with an accuracy of 0.1 nm. These results pave the way to further extend the use of LEIS for the characterization of features buried inside the first few nanometers of a sample.

Surface Decorations on Mixed Ionic and Electronic Conductors: Effects on Surface Potential, Defects, and the Oxygen Exchange Kinetics.

The oxygen exchange kinetics of epitaxial Pr0.1Ce0.9O2-δ electrodes was modified by decoration with submonolayer amounts of different basic (SrO, CaO) and acidic (SnO2, TiO2) binary oxides. The oxygen exchange reaction (OER) rate and the total conductivity were measured by in situ PLD impedance spectroscopy (i-PLD), which allows to directly track changes of electrochemical properties after each deposited pulse of surface decoration. The surface chemistry of the electrodes was investigated by near-ambient pressure XPS measurements (NAP-XPS) at elevated temperatures and by low-energy ion scattering (LEIS). While a significant alteration of the OER rate was observed after decoration with binary oxides, the pO2 dependence of the surface exchange resistance and its activation energy were not affected, suggesting that surface decorations do not alter the fundamental OER mechanism. Furthermore, the total conductivity of the thin films does not change upon decoration, indicating that defect concentration changes are limited to the surface layer. This is confirmed by NAP-XPS measurements which find only minor changes of the Pr-oxidation state upon decoration. NAP-XPS was further employed to investigate changes of the surface potential step on decorated surfaces. From a mechanistic point of view, our results indicate a correlation between the surface potential and the altered oxygen exchange activity. Oxidic decorations induce a surface charge which depends on their acidity (acidic oxides lead to a negative surface charge), affecting surface defect concentrations, any existing surface potential step, potentially adsorption dynamics, and consequently also the OER kinetics.

Cathode Surface Segregating Modification for Boosting Oxygen Reduction Reactions: Coupling Theory and Experiment in Proton Conducting Solid Oxide Fuel Cells (H-SOFCs)

Computational simulation, based on Density Functional Theory (DFT), was carried out to develop a more powerful cathode material, La0.35Bi0.15Sr0.5FeO3-δ (LBSF), based on a first-generation cathode material, La0.5Sr0.5FeO3-δ (LSF) for use in proton-conducting solid oxide fuel cells (H-SOFCs). The calculation results show that the Bi substitution causes an oxygen p band center shift, which accelerates the oxygen reduction reaction (ORR). To prove this prediction, LBSF and LSF was synthesized successfully, and each surface was also characterized with X-ray photoelectron spectroscopy (XPS) and low energy ion scattering (LEIS), observing a surface Sr segregation and change after Bi substitution. The change proves an effective modification of surface segregation component. Subsequently, LBSF, applied into H-SOFCs, shows excellent performance with a peak power density of 1630 mW cm-2 at 700 ℃ when this material was employed as a cathode in a full H-SOFC.

Low-Energy Ion Scattering Intensities from Supported Nanoparticles: The Spherical Cap Model

Supported nanoparticles are of great importance to many technologies like fuel processing and chemical synthesis using catalysts and electrocatalysts, energy storage and generation using fuel cells and batteries, electrochemistry, magnetic information storage, and more. Low-energy ion scattering spectroscopy (LEIS) with noble gas ions like He+ is a powerful tool for the characterization of nanoparticles dispersed across flat support surfaces due to its ability to probe the elemental composition in the topmost atomic layer of a surface, providing quantitative information regarding the size and number density of nanoparticles. In this work, we present a derivation of the LEIS intensities expected from nanoparticles and the support material as a function of the average particle size, their number per unit area, and their contact angle with the support when modeled as spherical caps of the nanoparticle material dispersed over the surface of a flat support. The model assumes that the ion intensities are determined only by the physical blocking of linear ion trajectories and independent of the tilt angle of the local surface relative to the incident and scattered ion directions, an assumption we support by quantitative modeling of published data which tested tilt-angle effects. The model is a generalization to arbitrary contact angles of the hemispherical cap model, which assumes 90° contact angle and has been widely used to model spectroscopic signals in LEIS (and also in Auger and photoelectron spectroscopies) during nanoparticle growth. This new model quantitatively reveals how LEIS signals are sensitive not only to the diameter and number density of the nanoparticle but also to their contact angle (or height/diameter ratio). With the use of additional data (e.g., from microscopy or adsorption microcalorimetry), the model presented here will enable more accurate determination of the average size, shape, and number density of supported nanoparticles based on LEIS intensity measurements.

High-Throughput Area-Selective Spatial Atomic Layer Deposition of SiO2 with Interleaved Small Molecule Inhibitors and Integrated Back-Etch Correction for Low Defectivity.

A first-of-its-kind area-selective deposition process for SiO2 is developed consisting of film deposition with interleaved exposures to small molecule inhibitors (SMIs) and back-etch correction steps, within the same spatial atomic layer deposition (ALD) tool. The synergy of theseaspects results in selective SiO2 deposition up to~23nm with high selectivity and throughput, with SiO2 growth area and ZnO nongrowth area. The selectivity is corroborated by both X-ray photoelectron spectroscopy (XPS) and low-energy ion scattering spectroscopy (LEIS). The selectivity conferred by two different SMIs, ethylbutyric acid, and pivalic acid has been compared experimentally and theoretically. Density Functional Theory (DFT) calculations reveal that selective surface functionalization using both SMIs is predominantly controlled thermodynamically, while the better selectivity achieved when using trimethylacetic acid can be explained by its higher packing densitycompared to ethylbutyric acid. By employing the trimethylacetic acid as SMI on other starting surfaces (Ta2 O5 , ZrO2 ,etc.) and probing the selectivity, a broader use of carboxylic acid inhibitors for different substrates is demonstrated. It is believed that the current results highlight the subtleties in SMI properties such as size, geometry, and packing, as well as interleaved back-etch steps, which are key in developing ever more effective strategies for highly selective deposition processes.

New insights into thermal processes of metal deposits on h-BN/Rh(1 1 1): A comparison of Au and Rh

In this paper the thermal properties of Au and Rh deposits are compared on hexagonal boron nitride (h-BN) “nanomesh” prepared on Rh(111), applying STM, XPS, low energy ion scattering (LEIS), LEED, and DFT. At room temperature, both metals essentially follow Volmer-Weber (3D) growth. Upon subsequent annealing, agglomeration (sintering), intercalation, and desorption are competing surface processes for both metals. For the more reactive Rh, we suggest an additional encapsulation mechanism: between 600 K and 750 K, fragments of decomposed h-BN diffuse locally from the bottom onto the metal clusters covering them partially. STM data indicates that agglomeration of gold nanoparticles proceeds faster compared to rhodium. At higher temperatures (∼1050 K–1100 K), all non-desorbing gold atoms diffuse below h-BN, even for large initial coverages. On the other hand, for larger Rh deposits (≥5 ML), the outermost layer always contains Rh. Accumulation of gold at the interface between h-BN and Rh(111) significantly enhances the thermal stability of h-BN, attributed to the lower reactivity of Au in the decomposition of h-BN compared to Rh(111). At elevated substrate temperatures, intercalation of individual adatoms takes place during deposition, which requires higher temperatures for rhodium due to its slower diffusion and higher probability of nucleation.

Electron Spectroscopy of Charge Exchange Effects in Low Energy Ion Scattering at Surfaces: Case Studies of Heavy Ions at Al Surface

This work discusses studies of electron emissions during the interaction of low energy (in the keV energy range and below) singly charged ions with Aluminum surfaces. Analysis of the spectra provides insight into the electronic excitation processes and the dynamics of the interaction of the projectiles with the surface excitation. The work is primarily focused on the clarification of the role of electron promotion in charge exchange processes that occur during the cascade of atomic collisions. The work highlights the importance of the solid environment and of electron correlation in the understanding of charge exchange and energy deposition in ion-solids interactions.

Charge exchange between He+ ions and solid targets: The dependence on target electronic structure revisited

This work compares the charge exchange properties of a large set of pure elemental solid targets by studying the neutralisation and reionisation in low-energy ion scattering (LEIS) experiments with He+ as incident ion. Neutralisation is extracted from the characteristic velocity in inverse velocity plots, while reionisation of neutralised He scattered on sub-surface atoms is studied through the threshold energy and intensity of so-called tails in LEIS spectra. Our work qualitatively reproduces the previously reported systematic dependence of neutralisation probability versus group (column) in the periodic table. However, such a trend is not observed for the reionisation probability, which is in contradiction to previously published results on neutral He backscattering. The results are discussed in terms of the electronic structure of transitions metals and charge exchange in close collision.