Improved Sample Holder Research Articles

Improved quantitation of SIMS depth profile measurements of niobium via sample holder design improvements and characterization of grain orientation effects

The importance of SIMS analyses for “N-doped” impurity alloyed niobium and other surface-alloyed materials continues to increase. A major hurdle is the uncertainty of instrument calibration due to changes in sample height either from sample surface topography or from the sample holder itself. The CAMECA sample holder design allows for many types of samples to be analyzed. However, a drawback is that the holder faceplate can bend, contributing an uncertainty in the relative sensitivity factor (RSF) used to quantify the SIMS results. Here, we describe an improved sample holder having a reinforced faceplate, which prevents deflection and reduces uncertainty. Simulations show that the new design significantly reduces deflection from 10 μm to 5 nm. Sample measurements show a reduction of RSF uncertainty from this source from 4.1% to 0.95%. Grain orientation has long been suspected to affect RSF measurement as well. A bicrystal implant standard, consisting of randomly oriented and [001] grains, was successively rotated 15° between analyses. It was observed that 20% of the analyses performed on the randomly oriented grain exhibited anomalously high RSF values as well as slow sputter rates. These features were associated with the changing grain normal orientation with respect to the primary Cs+ beam. The grain orientation associated with the rise in RSF was simulated and determined to be the [101] crystallographic plane, thus indicating that ion channeling was responsible for the significantly increased RSF. Focused ion beam analysis confirmed slower sputter rates for the cardinal crystallographic orientations, indicating that ion channeling occurred for each.

Challenges and Solutions for Handling and Characterizing Alkali-Tc-Oxide Salts

ABSTRACTThough not often discussed explicitly in literature, sample handling and preparation for advanced characterization techniques is a significant challenge for radiological materials. In this contribution, a detailed description is given of method development associated with characterization of highly radioactive and, in some cases, hygroscopic oxides of technetium. Details are given on developed protocols, fixtures, and tooling designed for x-ray and neutron diffraction, x-ray absorption, Raman spectroscopy, magic angle spinning nuclear magnetic resonance, and electron paramagnetic resonance. In some cases, multiple iterations of improved sample holder design are described. Lessons learned in handling Tc compounds for these and similar characterization methods are discussed.

Improved sample holder for multidetector neutron spectrometers

The standard design for hollow cylindrical liquid sample holders used in neutron scattering on multidector spectrometers is neither elegant nor safe. It can be improved in a very simple way by placing the seal directly above the sample volume.

An alternative approach to vector vibrating sample magnetometer detection coil setup

Vector vibrating sample magnetometers (VSMs) can present problems with respect to angular dependent calibration and positional dependency when they are used for measurements on thin film samples, which have dimensions comparable to or larger than the sample–coil distances. The problems are due to the fact that in conventional VSMs the sample is rotating with respect to the coils, when performing angular dependent measurements. In this article a solution is presented based on a setup of VSM detection coils, whose position is linked to that of the sample. Together with a newly designed sample holder, the above mentioned problems are prevented or reduced. The vector detection coil system shows a relatively small error in the determination of the magnetization vector (±1% in the absolute value and ±0.6° in the angle). Furthermore, it has a relatively small positional dependency (1% per mm) combined with a sufficient sensitivity (1 nA m2 or 1 μemu at 10 s time constant) and a capability of using samples up to 10×10 mm2. The improved sample holder for thin film measurements reduces positional problems while, at the same time, reducing the background signals of the holder (to 10 pA m2 per kA/m or 7.958×10−10 emu/Oe).

Toward development of an ideal X-ray diffractometer sample holder

A new and improved sample holder for use with powder X-ray diffractometry has been developed. This holder is made from a semiconductor grade silicon single crystal cut perpendicular to the [911] axis, i.e., Si (911). This crystal meets most of the basic requirements of an ideal zero background plate, with practically no interference lines. The pattern obtained, by using this crystal as background plate, is very clean, and even very low-intensity Bragg reflections of samples can be detected easily.

Development of an improved XRD sample holder

A new and improved sample holder suited for small samples has been developed for X-ray diffractometry. This holder is made from a commercial semiconductor grade of silicon wafer grown and cut along the [100]-axis, i.e., Si(100). This new holder not only meets almost all basic requirements of an ideal holder, namely, flat and damage free surface, low background noise, few interference peaks, and desired shape with different cavity sizes, but also provides additional advantages for measuring crystallite sizes and mass absorption coefficients. Furthermore, this holder is easy to clean and has good appearance because of its polished surface. A U.S. patent has been issued and a commercialization effort is underway.

Modified sample holder for low-temperature deep-level transient spectroscopy, current-voltage and capacitance-voltage measurements

This note describes the design, construction, and test results of a modified sample holder used during low-temperature deep-level transient spectroscopy, current-voltage and capacitance-voltage measurements. This improved sample holder allows temperature scan rates of up to 6 K/min with a temperature shift of less than 1 K. High electrical isolation makes this sample holder also suitable for low-temperature current-voltage and capacitance-voltage measurements.

Improved Sample Holder for Refractive Index Measurements of Small, Single, Glass Fragments

Abstract A simple method is described to convert the flat microscope slide into an improved sample holder for refractive index determination of single, small, glass fragments and their subsequent easy recovery for additional examinations.

An improved sample holder and its use in the distinction of natural and synthetic ruby as well as natural and synthetic amethyst

An improved sample holder and its use in the distinction of natural and synthetic ruby as well as natural and synthetic amethyst

An Improved Sample Holder for the Martindale Abrasion Tester

An Improved Sample Holder for the Martindale Abrasion Tester

An Improved Sample Holder for the Martindale Abrasion Tester—Reply

An Improved Sample Holder for the Martindale Abrasion Tester—Reply

An Improved Sample Holder for the Martindale Abrasion Tester

An Improved Sample Holder for the Martindale Abrasion Tester

Improved Sample Holder for X‐Ray Diffractometer Furnace

Journal of the American Ceramic SocietyVolume 46, Issue 1 p. 59-60 Improved Sample Holder for X-Ray Diffractometer Furnace ERNEST M. LEVIN, ERNEST M. LEVINSearch for more papers by this authorFLOYD A. MAUER, FLOYD A. MAUERSearch for more papers by this author ERNEST M. LEVIN, ERNEST M. LEVINSearch for more papers by this authorFLOYD A. MAUER, FLOYD A. MAUERSearch for more papers by this author First published: January 1963 https://doi.org/10.1111/j.1151-2916.1963.tb13773.xCitations: 6 The writers are, respectively, physical chemist and physicist, Inorganic Solids Division, National Bureau of Standards, Washington, D. C. AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinkedInRedditWechat No abstract is available for this article.Citing Literature Volume46, Issue1January 1963Pages 59-60 RelatedInformation