Summary In this work, we introduce the probabilistic inversion of tomographic complex resistivity (CR) measurements using the Hamiltonian Monte Carlo (HMC) method. The posterior model distribution on which our approach operates accounts for the underlying complex-valued nature of the CR imaging problem accurately by including the individual errors of the measured impedance magnitude and phase, allowing for the application of independent regularization on the inferred subsurface conductivity magnitude and phase, and incorporating the effects of cross-sensitivities. As the tomographic CR inverse problem is non-linear, of high dimension and features strong correlations between model parameters, efficiently sampling from the posterior model distribution is challenging. To meet this challenge we use HMC, a Markov-chain Monte Carlo method that incorporates gradient information to achieve efficient model updates. To maximize the benefit of a given number of forward calculations, we use the No-U-Turn sampler (NUTS) as a variant of HMC. We demonstrate the probabilistic inversion approach on a synthetic CR tomography measurement. The NUTS succeeds in creating a sample of the posterior model distribution that provides us with the ability to analyze correlations between model parameters and to calculate statistical estimators of interest, such as the mean model and the covariance matrix. Our results provide a strong basis for the characterization of the posterior model distribution and uncertainty quantification in the context of the tomographic CR inverse problem.