We investigated the relation between the surface resistance (Rs) and the critical current density (Jc) of YBCO thin films as a function of an angle of the applied dc magnetic field. The Rs of YBCO thin film deposited on a MgO (100) substrate was measured using a microstrip line resonator (MSLR) method. After the MSLR in a closed-type Cu cavity was cooled at 4K under a zero dc field, dc magnetic field strengths up to 5.0T were applied. The Rs measured when the field was parallel to the film was less than that measured when the field was perpendicular to the film. The dependence of the Jc on angle of the applied magnetic field was measured using a vibrating sample magnetometer. The Jc decreased with increasing angle of the applied magnetic field. We could qualitatively explain the relation between the Rs and the Jc for magnetic fields applied parallel or perpendicular to the film.