Effects of secondary electron emission (SEE) on the plasma density and electron excitation dynamics in dual-frequency (2 MHz and 14 MHz) capacitively coupled Ar plasmas are investigated. The plasma density np is measured with a hairpin probe, and the spatio-temporal distribution of electron excitation rate (ground state into Ar 2p1 state) is determined by phase resolved optical emission spectroscopy. It is generally found that as the low-frequency (LF) voltage ϕL increases, np first decreases at low ϕL, due to compressed the plasma bulk length by the LF source, and then increases slightly with ϕL, suggesting that the plasma is dominated by the α mode. When ϕL exceeds some critical value, np increases dramatically with ϕL, due to significantly enhanced ionization by secondary electrons, indicating a α–γ mode transition. An excitation pattern caused by SEE at the edge of the completely expanded LF sheath is observed at relatively high ϕL. Under various conditions, including the high-frequency voltage ϕH, the pressure p, the electrode gap L, and the electrode material, different dependences of np on ϕL are also discussed. It is found that the discharge turns into the γ mode at a lower ϕL when ϕH is higher. As p increases, the density peak moves axially towards the powered electrode, due to reduced sheath thickness, while its distance to the powered electrode is almost independent of other external conditions (ϕH, L, electrode material, etc). A higher p or higher L is favorable for the enhancement of np in γ mode, because secondary electrons can contribute more to the ionization. Due to the higher SEE coefficient of the aluminum electrode, a more significant increase in np in the γ mode can be seen than that with a stainless steel or copper electrode. Meanwhile, the spatio-temporal distributions of the electron excitation rate under the same conditions are analyzed to further understand the SEE effects.