ABSTRACT The oxidation behavior of IG-110, a graphite core component, was investigated at temperatures ranging from 400 to 1000°C in a 10 ppm Ar/O2 flow to simulate the oxidation process between the graphite core component and helium coolant with low O2 concentrations employed in advanced High-Temperature Gas-cooled Reactors (HTGRs). The results reveal that IG-110 undergoes significant mass loss at temperatures above 700°C, resulting in total mass changes of −1.5%, −5.3%, and −9.0% at 700, 800, and 1000°C, respectively, during a 10-hour oxidation period. No significant mass loss is observed below 600°C. To understand the oxidation mechanism of IG-110 under low O2 concentrations, we propose a kinetic model as the current chemical kinetic-controlled model does not fully explain the oxidation behavior observed in our research. Our analysis shows lower estimated reaction rates compared to studies at higher O2 concentrations; the activation energy values exhibit good agreement. The proposed kinetic model sheds light on the oxidation mechanism of IG-110 under 10 ppm Ar/O2 flow. This study provides new insights into the oxidation behavior of graphite core components in HTGRs and highlights the importance of controlling the O2 concentration in the helium coolant to prevent severe degradation of SiC-matrix fuel compacts.