Full Sampling Rate Research Articles

A 1.8-V 22-mW 10-bit 30-MS/s Pipelined CMOS ADC for Low-Power Subsampling Applications

This paper describes a 10-bit 30-MS/s subsampling pipelined analog-to-digital converter (ADC) that is implemented in a 0.18 mum CMOS process. The ADC adopts a power efficient amplifier sharing architecture in which additional switches are introduced to reduce the crosstalk between the two opamp-sharing successive stages. A new configuration is used in the first stage of the ADC to avoid using a dedicated sample-and-hold amplifier (SHA) circuit at the input and to avoid the matching requirement between the first multiplying digital-to-analog converter (MDAC) and flash input signal paths. A symmetrical gate-bootstrapping switch is used as the bottom-sampling switch in the first stage to enhance the sampling linearity. The measured differential and integral nonlinearities of the prototype are less than 0.57 least significant bit (LSB) and 0.8 LSB, respectively, at full sampling rate. The ADC exhibits higher than 9.1 effective number of bits (ENOB) for input frequencies up to 30 MHz, which is the twofold Nyquist rate (fs/2), at 30 MS/s. The ADC consumes 21.6 mW from a 1.8-V power supply and occupies 0.7 mm2, which also includes the bandgap and buffer amplifiers. The figure-of-merit (FOM) of this ADC is 0.26 pJ/step.

A partially switched-opamp technique for high-speed low-power pipelined analog-to-digital converters

This paper presents a partially switched-opamp technique for a high-speed, low-power pipelined analog-to-digital converter (ADC). Unlike a conventional switched-opamp technique, only the second stage of a two-stage opamp is switched with the enhanced power efficiency and the drawbacks of an opamp sharing technique and a conventional switched-opamp technique are addressed. The prototype of 8-bit 200-MS/s pipelined ADC is implemented in a 0.18-/spl mu/m CMOS process technology. This converter achieves 55.8-dB spurious free dynamic range, 47.3-dB signal-to-noise-plus-distortion ratio, 7.68 effective number of bits for a 90-MHz input at full sampling rate, and consumes 30-mW from a 1.8-V supply. The active area of the ADC is 0.15 mm/sup 2/.

A 69-mW 10-bit 80-MSample/s pipelined CMOS ADC

A 10-bit 80-MS/s analog-to-digital converter (ADC) with an area- and power-efficient architecture is described. By sharing an amplifier between two successive pipeline stages, a 10-bit pipeline is realized using just four amplifiers with a separate sample-and-hold block. The proposed feedback signal polarity inverting (FSPI) technique addresses the drawback of the conventional amplifier sharing technique. A wide-swing wide-bandwidth telescopic amplifier and an early comparison technique with a constant delay circuit have been developed to further reduce power consumption. The ADC is implemented in a 0.18-μm dual-gate-oxidation CMOS process technology, achieves 72.8-dBc spurious free dynamic range, 57.92-dBc signal-to-noise ratio, 9.29 effective number of bits (ENOB) for a 99-MHz input at full sampling rate, and consumes 69 mW from a 3-V supply. The ADC occupies 1.85 mm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> .

Design and test methodology for an analog-to-digital converter multichip module for experimental all-digital radar receiver operating at 2 gigasamples/s

In this paper, we describe the development of an analog-to-digital (A/D) converter subsystem, based on a monolithic A/D converter chip, a demultiplexer chip, and a laminate multichip module, for an experimental all-digital receiver for an airborne radar. The evolution of techniques for recording and analyzing all the data from the assembled multichip module at the full sample rate of the A/D converter, and the ways in which this test data can be used to analyze the performance of A/D converters, are described. The problems which arise in the testing of GHz A/D converters, a number of which are unique to A/D conversion at such high sample rates, are pointed out. Finally, comments on future directions in the test of high performance A/D converters are presented.

One Gigasample per Second Transient Recorder: A Performance Demonstration

The performance demonstrated by a one gigasample per second (1Gs/s) transient recorder currently in advanced development portends an important new instrument for recording single transient data. A Charge-Coupled Device (CCD) is used to sample a continuous analog signal. Samples acquired at the full sampling rate (1Gs/s) are temporarily stored in the CCD, then read out at a slow rate (e.g., 250Ks/s) into a conventional analog-to-digital converter prior to storage in nonvolatile, digital memory. Enhanced circuitry and techniques developed over the past three years have yielded higher performance than originally anticipated. Accordingly, the target specification shown in Table 1 has been revised to reflect higher expectations.