Abstract
In this paper, we describe the development of an analog-to-digital (A/D) converter subsystem, based on a monolithic A/D converter chip, a demultiplexer chip, and a laminate multichip module, for an experimental all-digital receiver for an airborne radar. The evolution of techniques for recording and analyzing all the data from the assembled multichip module at the full sample rate of the A/D converter, and the ways in which this test data can be used to analyze the performance of A/D converters, are described. The problems which arise in the testing of GHz A/D converters, a number of which are unique to A/D conversion at such high sample rates, are pointed out. Finally, comments on future directions in the test of high performance A/D converters are presented.
Published Version
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