In this article the resonant properties of the plant for the investigation of Ku-band magnetrons’ operation in the low-frequency domain from 100 kHz to 35 MHz were experimentally investigated.Improving the electronic devices’ quality is an important task for Ukrainian scientists. It will increase the duration and reliability of sophisticated equipment based on electronic devices, as well as improve the production economic efficiency in the electronics industry.The most common M-type device, the magnetron, was selected as the studied object. Low-frequency oscillation modes were influenced to the magnetrons’ output spectrum quality. Theses modes can occur in the device itself, as well as in the power supply circuits or be induced from the ether. It is hypothesized that spurious oscillations which may impair the electronic devices output spectrum quality, in particular magnetrons, will be amplified at frequencies which the resonances in the device, the supply circuits, and the system as a whole are observed. The experimental study is aimed to determine the frequency domain of the possible occurrence of these spurious oscillations.The measuring plant for magnetron research consists of a magnetron, a wave type transducer, an absorbent power meter, and a spectrum analyzer. The total error of this setup does not exceed ±4 dB.The resonant properties study of this plant in the low-frequency domain was performed according to the classical scheme of the resonant properties study of oscillating circuits. The total relative error of resonance properties measurements did not exceed ±8 %.As a result of research, it was discovered a pronounced resonant peak of the magnetron supply circuits in the 30 MHz band, magnetron filament circuits have a pronounced resonant peak in the 20 MHz band, the magnetron has two pronounced peaks in the 5 and 20 MHz band and two peaks in the 15 and 35 MHz band, the system as a whole has two pronounced peaks in the 10 and 30 MHz band.