Research of low frequency components of a magnetron oscillator spectrum

Inna Moshchenko,Chen Xin,Oleksandr Nikitenko

doi:10.24027/2306-7039.4.2019.195954

Abstract

In this article the resonant properties of the plant for the investigation of Ku-band magnetrons’ operation in the low-frequency domain from 100 kHz to 35 MHz were experimentally investigated.Improving the electronic devices’ quality is an important task for Ukrainian scientists. It will increase the duration and reliability of sophisticated equipment based on electronic devices, as well as improve the production economic efficiency in the electronics industry.The most common M-type device, the magnetron, was selected as the studied object. Low-frequency oscillation modes were influenced to the magnetrons’ output spectrum quality. Theses modes can occur in the device itself, as well as in the power supply circuits or be induced from the ether. It is hypothesized that spurious oscillations which may impair the electronic devices output spectrum quality, in particular magnetrons, will be amplified at frequencies which the resonances in the device, the supply circuits, and the system as a whole are observed. The experimental study is aimed to determine the frequency domain of the possible occurrence of these spurious oscillations.The measuring plant for magnetron research consists of a magnetron, a wave type transducer, an absorbent power meter, and a spectrum analyzer. The total error of this setup does not exceed ±4 dB.The resonant properties study of this plant in the low-frequency domain was performed according to the classical scheme of the resonant properties study of oscillating circuits. The total relative error of resonance properties measurements did not exceed ±8 %.As a result of research, it was discovered a pronounced resonant peak of the magnetron supply circuits in the 30 MHz band, magnetron filament circuits have a pronounced resonant peak in the 20 MHz band, the magnetron has two pronounced peaks in the 5 and 20 MHz band and two peaks in the 15 and 35 MHz band, the system as a whole has two pronounced peaks in the 10 and 30 MHz band.

Highlights

In the context of the rapid development of electronic devices and the continuous industry expansion the quality improvement is of particular importance, both to ensure the duration and reliability of the operation of sophisticated electronic devices, and to increase rapidly the economic efficiency of production in the electronics industry
The most important conditions for improving the electronic devices’ quality, the duration and reliability of their operation are the standardization of general requirements for the electronic devices (ED) quality assurance, the study and standardization of the various factors parameters influencing on the devices, and the creation of appropriate test methods
Solutions aimed at eliminating the detected deviations in the electronic devices quality, which require the obligatory development of measures to ensure these solutions implementation and the conditions to stimulate the production, teams and individual workers to improve the quality of the products they produce

Summary

Introduction

In the context of the rapid development of electronic devices and the continuous industry expansion the quality improvement is of particular importance, both to ensure the duration and reliability of the operation of sophisticated electronic devices, and to increase rapidly the economic efficiency of production in the electronics industry. Solutions aimed at eliminating the detected deviations in the electronic devices quality, which require the obligatory development of measures to ensure these solutions implementation and the conditions to stimulate the production, teams and individual workers to improve the quality of the products they produce. In addition to the factors discussed earlier [3, 4], the magnetrons output spectrum quality is influenced by the low-frequency oscillation modes which can occur in the device itself, as well as in the power circuits or be induced from the ether.

Results

Conclusion