Characterization of reliability and lifetime is a key issue on the way to commercialization of products based on organic electronics. Prediction of the lifetime requires the understanding of failure mechanisms and the circumstances leading to failure. In this work the stability of poly(triaryl amine) (PTAA) based organic field effect transistors (OFETs) on a poly(ethylene naphthalate) (PEN) substrate is investigated under environmental stressing. PTAA is known to form amorphous thin films after spin coating and to be air stable for extended periods of time. This inherent air stability makes it a good candidate for testing of environmental influences. The samples were electrically characterized regularly between storage cycles at 85 °C and 85 °C/85% relative humidity (RH). Samples stored under dry atmosphere and inert gas were used as reference. More than 1700 OFETs were produced in multiple batches and measured using an automated measurement system to collect statistically significant data. Circuit-relevant OFET parameters such as on- and off-current, mobility, threshold voltage and gate leakage current were extracted applying a thin film transistor (TFT) device model to the measured transfer and output curves. The threshold voltage is found to be the most sensitive parameter especially for the samples stored at 85 °C. The effect of storage under 85 °C/85%RH is observed to be comparably small. Fourier transform infrared (FT-IR) measurements of the aged OFET samples indicate a correlation between the shift of the electrical parameters and the appearance of carbonyl groups in the dielectric layer of the devices. Possible degradation mechanisms are discussed based on this observation.
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