Journal Article Advantages of Direct Detection and Electron Counting for Electron Energy Loss Spectroscopy Data Acquisition and the Quest of Extremely High-Energy Edges Using Eels Get access Paolo Longo, Paolo Longo Gatan Inc., 5794 W Las Positas Blvd, Pleasanton CA, USA Search for other works by this author on: Oxford Academic Google Scholar Jamie L Hart, Jamie L Hart Department of Materials Science and Engineering, Drexel University, Philadelphia, PA, USA Search for other works by this author on: Oxford Academic Google Scholar Andrew C Lang, Andrew C Lang Department of Materials Science and Engineering, Drexel University, Philadelphia, PA, USA Search for other works by this author on: Oxford Academic Google Scholar Ray D Twesten, Ray D Twesten Gatan Inc., 5794 W Las Positas Blvd, Pleasanton CA, USA Search for other works by this author on: Oxford Academic Google Scholar Mitra L Taheri Mitra L Taheri Department of Materials Science and Engineering, Drexel University, Philadelphia, PA, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 23, Issue S1, 1 July 2017, Pages 60–61, https://doi.org/10.1017/S1431927617000988 Published: 04 August 2017