We characterize by electrical techniques uniformly Si-doped AlAs layers and short-period GaAs-AlAs superlattices grown in the same conditions by molecular-beam epitaxy. Deep level transient spectroscopy shows that both the layers and the superlattices contain the DX center. The AlAs layers contain, in addition, a distribution of electron traps emitting in the temperature range 50–200 K. Using electron irradiation to introduce defects as probes we verified that the band structures of the superlattices we deduce are consistent with theoretical calculations using a widely accepted value of the band offset (67%). Finally, we observe that the DX center remains present, with the same ionization energy, when the energy position of the first Γ miniband varies while the first L miniband remains practically at the energetical position of the L band in the AlAs barriers. From this result we conclude that the DX center is linked to the L band and thus must be ascribed to an L effective-mass state.