The persistent photoconductivity of the rare earth ion doped ZnO is an emerging field. The present work focuses on the effect of samarium (Sm3+) ion doping on the persistence photo response behaviour ZnO host matrix. The Zn1-xSmxO (x = 0.0 to 0.10) thin films were deposited on chemically cleaned glass substrates using spray pyrolysis technique. The films showed polycrystalline nature and hexagonal wurtzite structure without any impurity peaks. The Zn0.93Sm0.07O films showed maximum crystallite size of 24.2 nm and minimum dislocation density. The gradual change in the thickness of the fibrous nature was observed with the addition of Sm3+ ions into ZnO lattice. Energy dispersive analysis of x-ray and X-ray photoelectron spectroscopy confirmed the presence of elements and its oxidation states in the deposited film respectively. The area under the curve of deconvoluted photoluminescence spectra of deposits confirmed the decrease in the various defect percentage with increase in the doping concentration of Sm3+ ions. The photoluminescence spectra of Zn0.93Sm0.07O films showed maximum near band edge emission and minimum defects. The Zn0.93Sm0.07O films showed higher carrier concentration of 1 × 1017 cm−3, mobility 32 cm2/Vs and lower resistivity of 1 × 102 Ω cm due to improved film quality. The Zn0.93Sm0.07O films exhibited the current value under dark and ultraviolet light illumination was in the range of 10−6 A and 10−4 A respectively. The maximum photocurrent was noticed at 375 nm which corresponds to the bandgap of the deposited films. The Zn0.93Sm0.07O films showed faster photo response (5 s and 131 s of response and recovery time) due to the presence of minimum trap states. Hence the Zn0.93Sm0.07O films can be used in the fabrication of light dependent resistors and ultraviolet sensors.
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