ScanningVolume 7, Issue 3 p. 158-161 Short NoteFree to Read Command of a mini-scanning electron microscope by digital computer for use in industrial process J. L. Franceschi, J. L. Franceschi Laboratoire d'Optique Electronique du C.N.R.S. associé à l'Université Paul Sabatier, 29, rue Jeanne Marvig, 31055 Toulouse Cedex, FranceSearch for more papers by this authorH. le Floch, H. le Floch Laboratoire d'Optique Electronique du C.N.R.S. associé à l'Université Paul Sabatier, 29, rue Jeanne Marvig, 31055 Toulouse Cedex, FranceSearch for more papers by this author J. L. Franceschi, J. L. Franceschi Laboratoire d'Optique Electronique du C.N.R.S. associé à l'Université Paul Sabatier, 29, rue Jeanne Marvig, 31055 Toulouse Cedex, FranceSearch for more papers by this authorH. le Floch, H. le Floch Laboratoire d'Optique Electronique du C.N.R.S. associé à l'Université Paul Sabatier, 29, rue Jeanne Marvig, 31055 Toulouse Cedex, FranceSearch for more papers by this author First published: 1985 https://doi.org/10.1002/sca.4950070308Citations: 1AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Citing Literature Volume7, Issue31985Pages 158-161 RelatedInformation