Fourier ptychographic microscopy (FPM) reconstructs high-resolution images through multiple iterations on a large number of sub-images at different angles, a process that is time-consuming. For a long time, various methods for optimizing the efficiency of FPM based on the acquisition process and algorithms have been proposed. However, there has been no specific analysis of the impact that the sub-images involved in the reconstruction have on the final result. In this Letter, we conduct the first, to our knowledge, analysis of the impact of a single sub-image on the reconstruction result of a high-resolution image in different numbers of iterations and obtain a curve depicting the change in image quality after the sub-images are involved in the reconstruction in different cycles. By analyzing this curve, the sub-images that exert a negative impact on the resulting image are exported along with their corresponding LED positions. On this basis, we propose the concept of bright-field spectral overlap ratio to distinguish whether the sub-images have a positive impact on the reconstruction results under different acquisition conditions and remove the sub-images that have a negative impact on the results during the iterative process. Both simulation and real experimental results demonstrate that our algorithm can reduce the reconstruction time while maintaining image quality. Moreover, it can be combined with other methods to improve reconstruction efficiency.