Laboratoire de Microstructures et de Microle´ctronique, 196 Avenue H. Ravera, Boiˆte Postale 107, 92195 Bagneux Cedex, France~Received 1 June 1999!This paper presents a complete study, theoretical as well as experimental, of an electromagnetic fieldscattered by subwavelength metallic pads, allocated in a periodic manner on a silica substrate. The simulationof the far field and near field is obtained with the differential method. When the sample is illuminated in totalinternal reflection, the simulations show that the amplification of the electromagnetic field above the Aumetallic pads depends on different parameters ~wavelength, polarization of light, angle of incidence, and indexof refraction!. In this paper, we only consider the effect of the probe-to-sample distance and of the polarizationof the illuminating light. As the experimental setup, we used the photon scanning tunneling microscope. If wecompare these results with the calculations carried out with the dielectric pads, we show that the amplificationis induced by the dielectric contrast between the metallic structures and their environment. Experimental resultsare presented in two different imaging modes. In the ‘‘constant intensity’’ mode, our experimental results arein excellent agreement with the simulations. Therefore, for a metallic sample analyzed in our experimentalconditions, it validates the assumption that the signal detected is proportional to the square modulus of theelectric field in the absence of the probe. We particularly show that if the polarization and the probe-to-sampledistance are suitably chosen, dramatic localizations of the electromagnetic field are observed. We then presentimages obtained in the so-called ‘‘two-wavelength’’ mode, where two light sources illuminate the sample. Thefirst beam is used for feedback regulation; it consequently allows a control of the tip motion, and permits us todetermine the reference surface. By using such feedback regulation for this first beam, we are able to comparequantitatively the effect of the polarization on the field distribution of the second beam. The results areconfirmed by the corresponding simulations.I. INTRODUCTION
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