To use Monte Carlo simulations to study the absorbed-dose energy dependence of GAFChromic EBT3 and EBT4 films for 5-200MeV electron beams and 100keV-15MeV photon beams considering two film compositions: a previous EBT3 composition (Bekerat etal.) and the final composition of EBT3/current composition of EBT4 (Palmer etal.). A water phantom was simulated with films at 5-50mm depth in 5mm intervals. The water phantom was irradiated with flat, monoenergetic 5-200MeV electron beams and 100 and 150keV kilovoltage and 1-15MeV megavoltage photon beams and the dose to the active layer of the films was scored. Simulations were rerun with the films defined as water to compare the absorbed-dose response of film to water, . For electrons, the Bekerat etal. composition had variations in of up to from 5to200MeV. Similarly, the Palmer etal. composition had differences in up to from 5to200MeV. For photons, varied up to and from 100keV to 15MeV for the Bekerat etal. and Palmer etal. compositions, respectively. The depth of films did not appear to significantly affect for photons at any energy and for electrons at energies 50MeV. However, for 5 and 10MeV electrons, decreases of up to in were seen due to stacked films and increased beam attenuation in films compared to water. The up to and variations in for electrons and photons, respectively, across the energies considered in this study indicate the importance of calibrating films with the energy intended for measurement. Additionally, this work emphasizes potential issues with stacking films to measure depth dose curves, particularly for electron beams with energies 10MeV.