Abstract Thin film deposition of cubic boron nitride (c-BN) is nowadays investigated in two different ways; the first is ion assisted deposition, the second a chemical approach without significant ion assistance. The latter is less well investigated, and up to now its suitability for c-BN deposition has not been proved. On the other hand, for ion assisted deposition universal parameter ranges have been found, and first models focusing on special aspects of the ion bombardment (subplantation, stress, sputtering) exist. The sputter model which was developed by our group is slightly modified, assuming the modification with the highest growth velocity to be favoured. With this formulation, all macroscopic parameter dependencies (ion to atom ratio, ion energy, ion mass, angle of ion incidence and substrate temperature) are well described. In this contribution, the microscopic processes during deposition will be discussed in light of recent experiments. The nucleation of c-BN yielding different structures (an amorphous layer followed by textured h-BN and finally nanocrystalline c-BN) and parameter dependencies is also included. The role of ion bombardment in general is twofold: on the one hand, it is up to now inevitably necessary to grow the c-BN phase at all temperatures; on the other hand, it causes problems of which high stress and, as a consequence, poor adhesion are the most significant. Adhesion failure occurs, if the forces at the interface exceed the atomic adhesion forces. Therefore, besides the reduction of film stress, improvement of the interface is worthy of investigation. Modelling of the latter is complicated by the complex nucleation sequence mentioned above. Some conventional means to improve adhesion (adhesion layers, stress reduction by annealing or high energy ion implantation) exist. Nevertheless, in view of applications, improvement of adhesion by a suitable choice of deposition parameters is highly desirable. In a simple model, stress is related to the defect concentration within the material which is governed by a balance between defect production due to ion bombardment, and thermal as well as ion assisted recombination processes. The model predicts the decrease of the stress with increasing ion energy in agreement with experimental data. The ion to atom ratio is of minor importance, whereas increasing the angle of ion incidence and the substrate temperature are predicted to decrease stress. Furthermore, approaches to change the nucleation behaviour during deposition are outlined. These are expected to improve the interface characteristics in view of the adhesion problem.