Two-phase multiferroic heterostructures composed of room-temperature ferroelectric BaTiO3 (BTO) and ferromagnetic La0.7Sr0.3MnO3 (LSMO) epitaxial thin films were grown on technologically important substrate Si (100). Bilayers of BTO/LSMO thin films display ferromagnetic Curie transition temperatures of ∼350 K, close to the bulk value, which are independent of BTO films thickness in the range of 25–100 nm. Discontinuous magnetization jumps associated with BTO structural transitions were suppressed in M(T) curves, probably due to substrate clamping effect. Interestingly, at cryogenic temperatures, the BTO/LSMO structure with BTO layer thickness of 100 nm shows almost 2-fold higher magnetic coercive field, 3-fold reduction in saturation magnetization, and improved squareness compared to the sample without BTO. We believe that the strong in-plane spin pinning of the ferromagnetic layer induced by BTO layer at BTO/LSMO interface could cause such changes in magnetic properties. This work forms a significant step forward in the integration of two-phase multiferroic heterostructures for CMOS applications.