Neutron inelastic scattering of copper ion conductors Cu 1.8S, Cu 1.8Se and CuI was measured by the time-of-flight (TOF) method at room temperature. Low-lying excitations near ħω≃3.4 meV, which had been observed in the measurement in Cu 2Se, existed in these copper ion conductors. A relation between the excitation energy and the mass of cations can be represented by h ̵ ω≃ 1 M .