A simple method for thinning barrier layers in various aluminum alloys was proposed, involving a linear voltage decrease at the end of sulfuric anodizing. Two techniques were used for barrier layer thickness assessment: direct measurement with field-emission gun scanning electron microscopy and indirect determination using electrochemical impedance spectroscopy. The linear thinning process was successfully tested on 1050 aluminum and on higher alloy element contents used for structural parts in aeronautics: 6062 and 2024 alloys. In our operating conditions, the linear thinning process reduces the barrier oxide at pore bottoms without modification of anodic layer porosity. The relationship for controlling barrier layer thickness (DBL) was established as DBL = U - a x Δt, with U (applied voltage) at 20 V, and Δt (ramp time) at 0 s, 30 s, 45 s, 60 s, and 90 s, with a constant rate (a) of 0.11 nm s−1 for all alloys. However, longer ramp times led to degradation at the pore bottoms, indicating that barrier layer morphology depends on the rate of voltage decrease. Shorter ramp times are preferable. The linear thinning process has potential applications in improving metal electrodeposition into the anodic layer by enhancing electrical accessibility to pore bottoms. Thinning the barrier layer effectively facilitates the electro-coloring process.
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