An in-situ study of the effect of strain-path change on deformation microstructure and slip activity has been investigated using samples of commercially pure aluminum. Changes in dislocation boundary arrangements and crystal lattice rotations were tracked using CMOS-based electron backscattered diffraction (EBSD) detector combined with in-situ tensile deformation of ε = 10%. Samples were first cold-rolled to 5% reduction and then deformed by uniaxial tensile along the transverse direction. Despite the use of a CMOS-based detector, analysis of deformation microstructure at such low plastic strains using EBSD is still challenging. Nevertheless in some grains details of the dominant deformation microstructure can be discerned. Slip line observations confirm that overall slip system activity is not influenced by the strain path change, but the EBSD observations show that in some cases dislocation boundary alignment is influenced by the presence of pre-existing boundaries, and in some grains the crystal rotations differ to those expected for tensile deformation of fully recrystallized grains of similar orientation.