Gold nanoparticles ( AuNP )-embedded indium oxide and indium tin oxide thin films were prepared by DC and DC magnetron reactive co-sputtering techniques. The concentration and size distribution of AuNP were changed by deposition conditions. The nanoparticles-embedded films were characterized by X-ray diffraction, transmission electron microscopy, and optical spectrophotometry. The X-ray diffraction data showed the polycrystalline nature of indium oxide and indium tin oxide along with the Au (111) peak confirming the presence of elemental AuNP in the matrices. The transmission electron microscope studies revealed that AuNP are distributed in the matrices in different shapes and sizes with the average sizes as 40 nm and 10 nm, respectively for DC-sputtered and DC magnetron-sputtered films. The optical absorbance measurements showed the SPR peak due to AuNP to be around 600 nm. The position and intensity of the SPR peak could be tuned from 650 to 570 nm by changing the concentration of AuNP and annealing the films in oxygen and Ar for different durations.
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