Infrared image sensing technology has attracted wide attention due to its advantages such as being unaffected by the environment, good target recognition, and strong anti-interference ability. However, with the improvement of the integration of infrared focal planes, the constraints between the dynamic range, noise, and full-shade of the optoelectronic system are particularly prominent. Therefore, in order to solve the contradiction between noise in weak light and full-shade capacity in strong light, in a 5 T infrared pixel circuit, the relationship between the capacitance value and voltage of the inverted MOS capacitor in a specific voltage range is used to make the integral capacitance of the infrared image sensor automatically change from 6.5 fF to 37.5 fF. A high dynamic pixel structure based on adaptive integral capacitance is proposed. Based on 55 nm CMOS process technology, 12288 × 12288its performance parameters are studied in a pixel-scale infrared sensor. The research results show that 5.5m × 5.5mthe small-size pixel has a large full-shade capacity of 1.31 Me- and a variable conversion gain, a noise of less than 0.43 e, and a dynamic range of more than 130 dB.