The authors here have reported two low-powered UV photodetectors designed with and without NiO as a hole transport layer (HTL) having the hybrid heterostructure of ZnO/CH3NH3PbI3 (Device1) and ZnO/CH3NH3PbI3/NiO (Device2) respectively. Both the devices showed good photoelectric parameters in UV region under self-powered condition. However, in Device1 due to its high dark current (390 nA), the responsivity (Rλ) and specific detectivity (D*) were degraded which were improved in Device2 (low dark current of 1.7 nA) after incorporating the NiO as an HTL. The maximum D* values of Device1 and Device2 in UV region are found to be of 5.5 × 108 Jones and 7.8 × 109 Jones at 0 V respectively. Moreover, an ultra-fast device response was obtained for Device2 with rise and fall times of 50 ms and 40 ms respectively. Also, the accumulation capacitance and conductance were found to be higher for Device2 making it a good candidate for low power photodetection application.