Three-dimensional stacked IC (3D-SIC) is a hot topic in both research and engineering circles alike. Multiple dies in a single package are not an entirely new phenomenon, as we already witnessed the use of Multi-Chip Modules (MCMs) two or three decades ago. We have even utilized vertical stacking of multiple chips, under terms as Package-onPackage (PoP) and System-in-Package (SiP). Recently however, a new and strong boost has been given to 3D die stacking with the advent of process technologies that enable the manufacturing of wafers containing Through-Silicon Vias (TSVs). TSVs allow architecting single-package multi-chip products using vertical interconnects with unprecedented density, performance, and low-power dissipation, thereby enabling the creation of a new generation of ‘super chips’. Test challenges are often considered as major obstacles to be resolved before bringing 3D-SICs to market. The readers of JETTA probably know better than others that a semiconductor product is not ready for volume production, if it cannot be adequately tested for manufacturing defects. The fact that today many researchers and practitioners from the test community are working on these 3D-SIC test challenges is a positive sign indicating that the TSV-based stacking technology is preparing itself for prime-time. The level of professional activities has drastically increased, as we witnessed the increase from a single conference paper in 2007 to now numerous publications, conference sessions, tutorials, a thriving 3D test access architecture standardization working group: IEEE P1838 (http://grouper.ieee.org/ groups/3Dtest), and even a dedicated workshop: the IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits (http://3dtest.tttc-events.org). The 3D-TEST Workshop has already had two very successful editions in 2010 and 2011, and its third edition is scheduled for November 2012, again in conjunction with ITC. What was so far still missing in this palette of activities was a journal special issue. That is now a reality with this February 2012 edition of JETTA. We find it quite appropriate for JETTA to be the first to publish a special issue on 3D-SIC testing, as after all this is the only journal devoted to test technology. The open Call for Papers for this special issue was first published at the 3D-TEST Workshop 2010 with its submission deadline in January 2011. We received a good set of submissions, which were all subjected to a thorough peer review process with, in most cases, multiple iterations between authors and reviewers. The result is in front of you: a special issue with ten articles covering 3D-SIC testing from various angles. This special issue starts off with a paper on test economics by Mottaqiallah Taouil et al. (Delft University of Technology and IMEC), entitled ‘Test Impact on the Overall Dieto-Wafer 3D Stacked IC Cost’. The authors evaluate various test flows that include or exclude pre-, mid-, and post-bond tests with respect to their impact on overall product costs. This is followed by two articles on defect-oriented testing. Yi Lou et al. (North-Carolina State University) compare sense amplification, leakage current monitors, and capacitance bridge methods as three pre-bond TSV test methods in ‘Comparing Through-Silicon-Via (TSV) Void/Pinhole Defect E. J. Marinissen (*) IMEC, Kapeldreef 75, B-3001 Leuven, Belgium e-mail: erik.jan.marinissen@imec.be