When performing low-frequency noise measurements on low-impedance electron devices, transformer coupling can be quite effective in reducing the contribution of the equivalent input noise voltage of the preamplifier to the background noise of the system. However, noise measurements on electron devices are usually performed with a biased device under test. A bridge configuration must be used to null the DC component at the input of the transformer. Unfortunately, using a bridge results in a complication of the set-up and degradation of the system’s sensitivity because of the noise introduced by the nulling arm. We propose an alternative approach for blocking the DC component that exploits the fact that supercapacitors with capacitances in excess of a few Farads are nowadays easily available. Actual measurement results in conventional and advanced measurement configurations are discussed that demonstrate the advantages of the approach we propose.