In this work we report on ballistic electron emission spectroscopy (BEES)studies on epitaxial layers of silver grown on silicon surfaces, with either aSi(111)-(7 × 7)or Si(100)-(2 × 1) surface reconstruction. The experiments were done at low temperature and in ultra-high vacuum(UHV). In addition, BEES measurements on polycrystalline Ag films grown on hydrogen-terminatedH:Si(111)-(1 × 1)and H:Si(100)-(2 × 1) surfaces were performed. The Schottky barrier heights were evaluated by BEES. Theresults are compared to the values for the barrier height reported for macroscopic Schottkydiodes. We show that the barrier heights for the epitaxial films substantially differ from thevalues measured on polycrystalline Ag films, suggesting a strong effect of the interface onthe barrier height.