Electrically-assisted forming (EAF) is a novel process that has shown the potential to reduce stress, improve formability, and accelerate recrystallization. However, the lack of a suitable physical coupling model due to the imperfect response mechanism of pulse current to dislocation density limits subsequent EAF finite element simulation. In this study, Ti60 alloy is subjected to periodic electro-assisted tensile (EAT) tests. The effects of current densities and pulse periods on dislocation density are expounded, and a physical coupling model based on dislocation density is established. The results are as follows: pulse current can promote the diffraction peak (001) to shift to a lower angle, and enhance the collision between electrons and atoms, elevating the rate of atomic diffusion. The phenomenon of recrystallization and grain growth leads to a decrease of dislocation density. After necking, the velocity of dislocation motion and annihilation is several times higher than that before necking, causing significant changes in flow stress. The modified Johnson-Cook (JC) model, which considers only temperature (T) and current density (J), exhibits a larger EAARE value after necking. Modified dislocation density (MDD) is a physical coupling model based on dislocation density (ρ), supplemented by current density (J) and temperature (T). The response of this model to flow stress is instantaneous, which can not only reflect the remarkable characteristics of the EAT process but also greatly improve the prediction accuracy after necking.
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