A thin amorphous film of fluoroplast (polytetrafluoroethylene) was obtained and studied by the electron diffraction structure analysis methods. The previously developed method of constructing the radial distribution function of atoms by the electron diffraction patterns from amorphous structures is applied, based on the determination of the normalization coefficient by varying the thermal parameter. The possibility of applying and necessary adaptations of this technique for the studied polytetrafluoroethylene samples are shown, taking into account its not quite usual amorphous structure due to the rigid spiral conformation of polymer chains …–CF2–…, which does not allow us to speak about the complete absence of the long-range order of the arrangement of atoms along the direction of the spiral axis. The measurements were carried out using the developed registration system on the electron diffraction camera EMR-102.