Areal Roughness Parameters Research Articles

Surface topography in ball-end milling processes as a function of feed per tooth and radial depth of cut

A numerical model was developed that predicts topography and surface roughness in ball-end milling processes, based on geometric tool–workpiece intersection. It allows determining surface topography as a function of feed per tooth and revolution, radial depth of cut, axial depth of cut, number of teeth, tool teeth radii, helix angle, eccentricity and phase angle between teeth. It determines profile roughness parameters, as well as areal roughness parameters such as average roughness Sa, maximum peak-to-valley roughness St, volume of summit material V and a proposed new time coefficient Ct. It relates surface roughness to milling time. Moreover, feed per tooth and revolution f and radial depth of cut Rd were calculated that minimise parameters Sa· Ct, St· Ct and V· Ct. Minimum Sa· Ct and St· Ct provide minimum roughness with minimum milling time. Minimum V· Ct means minimum milling time with minimum material removal in manual polishing operation. At low radial depth of cut, roughness is low regardless of feed employed. On the contrary, at high radial depth of cut, roughness depends remarkably on feed: the higher the feed, the higher the roughness. In order to simultaneously minimise roughness and time, high f and low Rd should be used. In that case also volume of summit material is minimised.

In Situ Roughness Measurements for the Solar Cell Industry Using an Atomic Force Microscope

Areal roughness parameters always need to be under control in the thin film solar cell industry because of their close relationship with the electrical efficiency of the cells. In this work, these parameters are evaluated for measurements carried out in a typical fabrication area for this industry. Measurements are made using a portable atomic force microscope on the CNC diamond cutting machine where an initial sample of transparent conductive oxide is cut into four pieces. The method is validated by making a comparison between the parameters obtained in this process and in the laboratory under optimal conditions. Areal roughness parameters and Fourier Spectral Analysis of the data show good compatibility and open the possibility to use this type of measurement instrument to perform in situ quality control. This procedure gives a sample for evaluation without destroying any of the transparent conductive oxide; in this way 100% of the production can be tested, so improving the measurement time and rate of production.