Thin films of indium tin oxide nanoparticles are studied using charge-coupled device thoermoreflectance. High resolution sub-micron thermal images confirm that percolation in current conduction induces strongly inhomogeneous heat loads on the thin film. We experimentally show that the inhomogeneous current densities induce thousands of “micro-hotspots” that can be 20% hotter than the average Joule heating in the thin film layer and show comparable behavior in a resistor network. In addition to the percolation induced “micro-hotspots,” we report major hotspots, with non-Joule behavior, whose temperature response is greater than I2. We demonstrate that a temperature dependent resistor can account for an effective exponent larger than 2. Finally, it is shown that while ambient molecules modify the thin film conductivity by at least 20%, current conduction and percolation effects remain largely unchanged, but such chemical reactions can be nonetheless detected with thermoreflectance.
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