High-resolution topography and local potential images together are very powerful tools for understanding the local environment of nanomaterials. In electrochemistry, there are significant changes within the electrode materials upon charging and discharging. However, the surface changes for pseudocapacitive materials in repetitive electrochemical cycling are easily being overlooked. Thanks to the advances in Atomic Force Microscopy, it becomes feasible to visualize the electrical changes in surface upon charge transfer with Kelvin Probe Force Microscopy (KPFM) equipped with a conductive tip. We report the KPFM surface potential images and profiles of NiO electrochromic films upon bleaching (charging) and coloration (discharging). The measured surface potential is about 60 times higher in bleaching state upon charging at 20mC/cm2. What is interesting is that the potential profile shows identical topographic features with the height profile of surface morphology. The surface particles further demonstrate shape entanglement in one direction (from ~100nm to ~140nm) and shrinkage in the orthogonal direction, suggesting the charge-induced electrical stress. According to the pseudocapacitive features in the cyclic voltammetry and electrochemical impedance spectroscopy, the surface-dominant redox behavior is within expectation. Though, this dynamic surface potential change is not well studied but important, and associated with work function fluctuations and various kinds of nanoscale charge-sensitive properties, especially for efficient electrochromic supercapacitor energy storage.