Определение характеристик мембран на основе нанопористого оксида алюминия методом АСМ

Abstract

This scientific work presents the results of a study of the structural features of membranes based on nanoporous alumina using atomic force microscopy (AFM). The capabilities of scanning probe microscopy (SPM), in particular atomic force microscopy, are widely known, but with regard to dielectric materials, the capabilities and advantages of AFM are increasing. The capabilities of AMS with respect to the surface of various nanostructured materials are primarily related to its resolving capabilities. The resolving power of AFM is primarily associated with cantilevers, which are used for surface scanning. In the case of studying the surface of membranes based on nanoporous alumina, the possibilities of AFM and the use of its various techniques are shown. Atomic force microscopy is used to study the surface of various dielectric solid and polymer samples. It is only necessary to select the required AFM technique for surface investigation. You also need to pay attention to the probes that are used for scanning.