In zircon (ZrSiO4), four different Periodic Bond Chains (PBCs) can be described, i.e. [001], 〈100〉, 〈1/2 1/2 1/2〉 and 〈1/2, 1/2, 1 1/2〉. F faces which grow slowly according to a layer mechanism, are {100} and {011}. Calculation of attachment energies, which are supposed to be directly proportional to the growth rates, is performed in electrostatic point charge models, model I: Zr4+Si4+O42-, model II: Zr4+Si2+O41.5-and model III Zr4+Si0O41-. The theoretical growth form is short prismatic following {100} and is terminated by the dipyramid {011}. The lower the oxygen charge the more elongated is the crystal parallel to the c axis. The slice d011 can be defined either bounded by zirconium (d001A) or by silicate tetrahedra (d011B. As these slice boundaries differ in height of one half slice with thickness d022, and as these half slices d022Aand do22Bare F faces, the growth of {011} may also take place by elementary growth layers of thickness d022. In that case the growth rates of {011} increase and the growth models are even more prismatic. The S form {031} could only be present on the theoretical growth form with formal charges, provided that the growth of {011} takes place with half slices d022 and the adsorption of impurities establishes additional strong bonds parallel to its slice boundaries. On the models with lower silicon and oxygen charges the form {031} is not present, but a reduction of the attachment energy of less than 0.1 percent would result into the appearance of {031} on these models as well. If O-H ⋯ O bonds could be formed by adsorption of protons, silica complexes or water molecules, additional hydrogen bonds parallel to 〈110〉 would establish the F character of {110} and {001}, which has been observed sometimes on minerals and synthetic crystals. Neutrally charged solvated silica complexes, such as Si(OH)4.2H2O, present as impurities on kink sites could reduce the growth rate of the forms {110} and {001}. NH4H2PO4 (ADP, Biphosphammite) has a crystal structure similar to that of zircon. The F forms of ADP are also {100} and {011}. The typical tapering observed on ADP crystals grown from Cr bearing aqueous solutions due to the presence of {0kl} with k>l is not common for zircon. The S form of ADP has such a relatively low attachment energy that it could also be present on the theoretical growth form.
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