Abstract
We have prepared YBa/sub 2/Cu/sub 3/O/sub 7-y/ thin films on {100} cube textured Ag tape (CUTE-Ag tape) by metal organic chemical vapor deposition (MOCVD). The obtained films are highly c axis oriented, and the surfaces of the films were smooth. However, the in-plane alignment of the films was not pure four-fold symmetric. Then we examined preparation of YBCO films on Y/sub 2/O/sub 3/ buffered CUTE-Ag tapes. The Y/sub 2/O/sub 3/ layer was deposited by MOCVD and the YBCO films on that layer was c axis oriented with good in-plane alignment. Furthermore after the YBCO films growth was terminated, the peak of Y/sub 2/O/sub 3/ almost disappeared. We considered that the Y/sub 2/O/sub 3/ layer was incorporated into the YBCO film during deposition. We also deposited YBCO films on {110} textured Ag tape for which good in-plane alignment of YBCO film was expected from the near-coincidence site lattice (NCSL) model. The critical temperature of both YBCO films on the CUTE-Ag tape and on the {110} textured Ag tape were T/sub c(zero)/=80 K.
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