X-Ray Probing for the Structural and Functional Studies of CdSe-CdS Nanoparticle for Detector Application

Abstract

AbstractX-ray beams of fine focus have been used for the study of very low dimension solids with very high resolution. In the present study, X-ray probing for the low dimension solids such as nanoparticles (NPs) of CdSe-CdS was emphasized. The photoluminescence quantum dots of CdSe-CdS were synthesized by the hot injection and short-time processing technique. The structure of the above quantum particle was analyzed using the X-ray diffraction technique. Again, electro conducting natural (ECN) fibre of narrow dimension about 15 μm, which was used as the substrate for the coating of the NPs for X-ray sensing application. The sensing plate made up of the ENC fibres coated with a thin film of NPs were arranged in a 10 × 10 mm2 active area. In-situ X-ray-induced electrical (V ~ I) characteristics of the sensing plate were carried out using MoKα1 (17 keV) characteristics line. However, the structural investigation of ECN fibre and the thin film of CdSe-CdS NPs coated ECN fibre surface was carried out using CuKα1 (8 keV) X-ray line. In this chapter, a systematic way of the fabrication process of CdSe-CdS QDs based photoluminescence detector and X-ray probing for the structural and functional studies have been discussed.KeywordsCdSe-CdSNanoparticleXRDX-raysQuantum dots